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Jeffrey A. Jalkio
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St. Paul, MN, US
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last 30 patents
Information
Patent Grant
Rotary sensor system with a single detector
Patent number
6,538,750
Issue date
Mar 25, 2003
CyberOptics Corporation
David Fishbaine
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Rotary sensor system with at least two detectors
Patent number
6,292,261
Issue date
Sep 18, 2001
CyberOptics Corporation
David Fishbaine
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method and apparatus for electronic component lead measurement usin...
Patent number
6,118,538
Issue date
Sep 12, 2000
CyberOptics Corporation
Carl E. Haugan
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
High precision semiconductor component alignment systems
Patent number
5,897,611
Issue date
Apr 27, 1999
CyberOptics Corporation
Steven K. Case
G01 - MEASURING TESTING
Information
Patent Grant
Multi-beam laser sensor for semiconductor lead measurements
Patent number
5,331,406
Issue date
Jul 19, 1994
CyberOptics Corporation
David Fishbaine
G01 - MEASURING TESTING
Information
Patent Grant
Laser-based semiconductor lead measurement system
Patent number
5,309,223
Issue date
May 3, 1994
CyberOptics Corporation
John P. Konicek
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for the noncontact measurement of drill diamet...
Patent number
5,005,978
Issue date
Apr 9, 1991
CyberOptics Corporation
Timothy A. Skunes
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Point and line range sensors
Patent number
4,891,772
Issue date
Jan 2, 1990
CyberOptics Corporation
Steven K. Case
G01 - MEASURING TESTING
Information
Patent Grant
Use of prisms to obtain anamorphic magnification
Patent number
4,872,747
Issue date
Oct 10, 1989
CyberOptics Corporation
Jeffrey A. Jalkio
G02 - OPTICS