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Jeffrey A. Koch
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Livermore, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Crystals for krypton helium-alpha line emission microscopy
Patent number
9,945,795
Issue date
Apr 17, 2018
National Security Technologies, Inc.
Jeffrey A. Koch
G01 - MEASURING TESTING
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Patent Grant
X-ray shearing interferometer
Patent number
6,590,954
Issue date
Jul 8, 2003
The United States of America as represented by the United States Department o...
Jeffrey A. Koch
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
CRYSTALS FOR KRYPTON HELIUM-ALPHA LINE EMISSION MICROSCOPY
Publication number
20170269010
Publication date
Sep 21, 2017
National Security Technologies, LLC
Jeffrey A. Koch
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND SYSTEMS FOR IMAGING BULK MOTIONAL VELOCITIES IN PLASMAS
Publication number
20160290939
Publication date
Oct 6, 2016
National Security Technologies, LLC
Jeffrey A. Koch
G01 - MEASURING TESTING