JEFFREY B. HURST

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CEDAR PARK, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Optical vacuum ultra-violet wavelength nanoimprint metrology
- Patent number 8,867,041
- Issue date Oct 21, 2014
- Jordan Valley Semiconductor Ltd
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Grant
Automated calibration methodology for VUV metrology system
- Patent number 8,153,987
- Issue date Apr 10, 2012
- Jordan Valley Semiconductors Ltd.
- Jeffrey B. Hurst
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Optical Vacuum Ultra-Violet Wavelength Nanoimprint Metrology
- Publication number 20120182542
- Publication date Jul 19, 2012
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Application
Automated calibration methodology for VUV metrology system
- Publication number 20100294922
- Publication date Nov 25, 2010
- JEFFREY B. HURST
- G01 - MEASURING TESTING