Jeffrey Bruce Bindell

Person

Orlando, FL, US

People

Patents Grantslast 30 patents

Information Patent Grant
Probe having a microstylet
- Patent number 6,727,720
- Issue date Apr 27, 2004
- Agere Systems Inc.
- Erik C. Houge
- G01 - MEASURING TESTING
Information Patent Grant
Probe tip locator having improved marker arrangement for reduced bi...
- Patent number 6,425,189
- Issue date Jul 30, 2002
- Agere Systems Guardian Corp.
- Jeffrey B. Bindell
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe for scanning probe microscopy and related methods
- Patent number 6,405,584
- Issue date Jun 18, 2002
- Agere Systems Guardian Corp.
- Jeffrey Bruce Bindell
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning electron microscope/energy dispersive spectroscopy sample...
- Patent number 6,362,475
- Issue date Mar 26, 2002
- Agere Systems Guardian Corp.
- Jeffrey B. Bindell
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting semiconductor defects
- Patent number 6,297,503
- Issue date Oct 2, 2001
- Lucent Technologies Inc.
- Jeffrey B. Bindell
- G01 - MEASURING TESTING
Information Patent Grant
Method of mapping a surface using a probe for stylus nanoprofilomet...
- Patent number 6,250,143
- Issue date Jun 26, 2001
- Agere Systems Guardian Corp.
- Jeffrey B. Bindell
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe tip locator
- Patent number 6,178,653
- Issue date Jan 30, 2001
- Lucent Technologies Inc.
- Joseph Edward Griffith
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Linewidth metrology of integrated circuit structures
- Patent number 5,804,460
- Issue date Sep 8, 1998
- Lucent Technologies, Inc.
- Jeffrey Bruce Bindell
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Probe having a microstylet and method of manufacturing the same
- Publication number 20030042922
- Publication date Mar 6, 2003
- Erik C. Houge
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD OF DETERMINING THE SHAPE OF A PROBE FOR A STYLUS PROFILOMETER
- Publication number 20020062572
- Publication date May 30, 2002
- Jeffrey Bruce Bindell
- G01 - MEASURING TESTING

Jeffrey Bruce Bindell

Person

Patents Grantslast 30 patents

Probe having a microstylet

Probe tip locator having improved marker arrangement for reduced bi...

Probe for scanning probe microscopy and related methods

Scanning electron microscope/energy dispersive spectroscopy sample...

Method of detecting semiconductor defects

Method of mapping a surface using a probe for stylus nanoprofilomet...

Probe tip locator

Linewidth metrology of integrated circuit structures

Patents Applicationslast 30 patents

Probe having a microstylet and method of manufacturing the same

METHOD OF DETERMINING THE SHAPE OF A PROBE FOR A STYLUS PROFILOMETER