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Jeffrey Byers
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Lexington, TX, US
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Patents Grants
last 30 patents
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Patent Grant
Target acquisition and overlay metrology based on two diffracted or...
Patent number
7,528,953
Issue date
May 5, 2009
KLA-Tencor Technologies Corp.
Aviv Frommer
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Computer-implemented method and carrier medium configured to genera...
Patent number
7,142,941
Issue date
Nov 28, 2006
KLA-Tencor Technologies Corp.
Chris Mack
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Computer-implemented method and carrier medium configured to genera...
Patent number
6,968,253
Issue date
Nov 22, 2005
KLA-Tencor Technologies Corp.
Chris Mack
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
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Patent Application
Diffraction order controlled overlay metrology
Publication number
20060197951
Publication date
Sep 7, 2006
KLA-Tencor Technologies Corporation
Aviv Frommer
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Computer-implemented method and carrier medium configured to genera...
Publication number
20060089741
Publication date
Apr 27, 2006
KLA-Tencor Technologies Corp.
Chris Mack
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Computer-implemented method and carrier medium configured to genera...
Publication number
20040225401
Publication date
Nov 11, 2004
Chris Mack
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY