Membership
Tour
Register
Log in
Jeffrey C. Andle
Follow
Person
Westbrook, ME, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Measurement of density and viscoelasticity with a single acoustic w...
Patent number
7,552,619
Issue date
Jun 30, 2009
Vectron International, Inc.
Jeffrey C. Andle
G01 - MEASURING TESTING
Information
Patent Grant
Control of equivalent shear rate in acoustic wave sensors
Patent number
7,219,537
Issue date
May 22, 2007
Vectron International, a division of Dover Electronics, Inc.
Jeffrey C Andle
G01 - MEASURING TESTING
Information
Patent Grant
Measurement, compensation and control of equivalent shear rate in a...
Patent number
7,181,957
Issue date
Feb 27, 2007
BIODE Inc.
Jeffrey C. Andle
G01 - MEASURING TESTING
Information
Patent Grant
Measurement, compensation and control of equivalent shear rate in a...
Patent number
7,007,546
Issue date
Mar 7, 2006
Biode Inc.
Jeffrey C. Andle
G01 - MEASURING TESTING
Information
Patent Grant
Multi-reflective acoustic wave device
Patent number
7,002,281
Issue date
Feb 21, 2006
BIODE Inc.
Jeffrey C. Andle
G01 - MEASURING TESTING
Information
Patent Grant
Temperature compensated, high efficiency diode detector
Patent number
6,825,715
Issue date
Nov 30, 2004
Biode, Inc.
Jeffrey C. Andle
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
ANTENNA FOR COUPLING ESD SENSITIVE MEASUREMENT DEVICES LOCATED IN H...
Publication number
20140240184
Publication date
Aug 28, 2014
Jeffrey C. Andle
G01 - MEASURING TESTING
Information
Patent Application
Measurement of density and viscoelasticity with a single acoustic w...
Publication number
20070144240
Publication date
Jun 28, 2007
Biode Inc.
Jeffrey C. Andle
G01 - MEASURING TESTING
Information
Patent Application
Control of Equivalent Shear Rate in Acoustic Wave Sensors
Publication number
20060191570
Publication date
Aug 31, 2006
Biode Inc.
Jeffrey C. Andle
G01 - MEASURING TESTING
Information
Patent Application
Measurement, compensation and control of equivalent shear rate in a...
Publication number
20060096357
Publication date
May 11, 2006
Jeffrey C. Andle
G01 - MEASURING TESTING
Information
Patent Application
Measurement, compensation and control of equivalent shear rate in a...
Publication number
20050132784
Publication date
Jun 23, 2005
Jeffrey C. Andle
G01 - MEASURING TESTING
Information
Patent Application
Temperature compensated, high efficiency, controlled input impedanc...
Publication number
20050057302
Publication date
Mar 17, 2005
Jeffrey C. Andle
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Multi-reflective acoustic wave device
Publication number
20050012431
Publication date
Jan 20, 2005
Jeffrey C. Andle
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
TEMPERATURE COMPENSATED, HIGH EFFICIENCY DIODE DETECTOR
Publication number
20040217807
Publication date
Nov 4, 2004
Jeffrey C. Andle
H03 - BASIC ELECTRONIC CIRCUITRY