Jeffrey C. Sherry

Person

Savage, MN, US

People

Patents Grantslast 30 patents

Information Patent Grant
Self flattening test socket with anti-bowing and elastomer retention
- Patent number 11,709,183
- Issue date Jul 25, 2023
- Johnstech International Corporation
- David T. Skodje
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit contact test apparatus with and method of constr...
- Patent number 11,467,183
- Issue date Oct 11, 2022
- Johnstech International Corporation
- Jeffrey Sherry
- G01 - MEASURING TESTING
Information Patent Grant
Waveguide integrated circuit testing
- Patent number 11,360,117
- Issue date Jun 14, 2022
- Johnstech International Corporation
- Jeffrey Sherry
- G01 - MEASURING TESTING
Information Patent Grant
Waveguide integrated circuit testing
- Patent number 11,307,232
- Issue date Apr 19, 2022
- Johnstech International Corporation
- Jeffrey Sherry
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit testing for integrated circuits with antennas
- Patent number 11,293,968
- Issue date Apr 5, 2022
- Johnstech International Corporation
- Jeffrey Sherry
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit contactor for testing ICs and method of construc...
- Patent number 11,209,458
- Issue date Dec 28, 2021
- Johnstech International Corporation
- John Nelson
- G01 - MEASURING TESTING
Information Patent Grant
High isolation contactor with test pin and housing for integrated c...
- Patent number 11,183,783
- Issue date Nov 23, 2021
- Johnstech International Corporation
- Jeffrey Sherry
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High isolation housing for testing integrated circuits
- Patent number 11,002,760
- Issue date May 11, 2021
- Johnstech International Corporation
- Jeffrey Sherry
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus and method for microcircuit testing with conical...
- Patent number 10,928,423
- Issue date Feb 23, 2021
- Johnstech International Corporation
- John DeBauche
- G01 - MEASURING TESTING
Information Patent Grant
Electrically conductive pins for microcircuit tester
- Patent number 10,877,090
- Issue date Dec 29, 2020
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit contact test apparatus with and method of constr...
- Patent number 10,794,933
- Issue date Oct 6, 2020
- Johnstech International Corporation
- Jeffrey Sherry
- G01 - MEASURING TESTING
Information Patent Grant
Self flattening test socket with anti-bowing and elastomer retention
- Patent number 10,761,112
- Issue date Sep 1, 2020
- Johnstech International Corporation
- David T. Skodje
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit contactor for testing ICs and method of construc...
- Patent number 10,725,069
- Issue date Jul 28, 2020
- Johnstech International Corporation
- John Nelson
- G01 - MEASURING TESTING
Information Patent Grant
Waveguide integrated testing
- Patent number 10,698,000
- Issue date Jun 30, 2020
- Johnstech International Corporation
- Jeffrey Sherry
- G01 - MEASURING TESTING
Information Patent Grant
High isolation contactor with test pin and housing for integrated c...
- Patent number 10,686,269
- Issue date Jun 16, 2020
- Johnstech International Corporation
- Jeffrey Sherry
- G01 - MEASURING TESTING
Information Patent Grant
Electrically conductive pins microcircuit tester
- Patent number 10,302,675
- Issue date May 28, 2019
- Johnstech International Corporation
- John E. Nelson
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Waveguide integrated testing
- Patent number 10,274,515
- Issue date Apr 30, 2019
- Johnstech International Corporation
- Jeffrey Sherry
- G01 - MEASURING TESTING
Information Patent Grant
Electrically conductive kelvin contacts for microcircuit tester
- Patent number 10,247,755
- Issue date Apr 2, 2019
- Johnstech International Corporation
- Joel N. Erdman
- G01 - MEASURING TESTING
Information Patent Grant
Resilient interposer with electrically conductive slide-by pins as...
- Patent number 10,073,117
- Issue date Sep 11, 2018
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus and method for microcircuit testing with conical...
- Patent number 10,067,164
- Issue date Sep 4, 2018
- Johnstech International Corporation
- John DeBauche
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus and method for microcircuit and wafer level IC te...
- Patent number 9,696,347
- Issue date Jul 4, 2017
- Johnstech International Corporation
- John DeBauche
- G01 - MEASURING TESTING
Information Patent Grant
Electrically conductive pins for microcircuit tester
- Patent number 9,678,106
- Issue date Jun 13, 2017
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Grant
Electrically conductive pins for load boards lacking Kelvin capabil...
- Patent number 9,606,143
- Issue date Mar 28, 2017
- Johnstech International Corporation
- Jeffrey C. Sherry
- G01 - MEASURING TESTING
Information Patent Grant
Electrically conductive kelvin contacts for microcircuit tester
- Patent number 9,500,673
- Issue date Nov 22, 2016
- Johnstech International Corporation
- Joel Erdman
- G01 - MEASURING TESTING
Information Patent Grant
Thermal management for microcircuit testing system
- Patent number 9,476,936
- Issue date Oct 25, 2016
- Johnstech International Corporation
- David Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Electrically conductive Kelvin contacts for microcircuit tester
- Patent number 9,329,204
- Issue date May 3, 2016
- Johnstech International Corporation
- Joel N. Erdman
- G01 - MEASURING TESTING
Information Patent Grant
Electrically conductive pins for microcircuit tester
- Patent number 9,297,832
- Issue date Mar 29, 2016
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Grant
Electrically conductive pins for microcircuit tester
- Patent number 9,007,082
- Issue date Apr 14, 2015
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Grant
Electrically conductive kelvin contacts for microcircuit tester
- Patent number 8,988,090
- Issue date Mar 24, 2015
- Johnstech International Corporation
- Joel N. Erdman
- G01 - MEASURING TESTING
Information Patent Grant
Microcircuit tester with slideable electrically conductive pins
- Patent number 8,937,484
- Issue date Jan 20, 2015
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT TESTING FOR INTEGRATED CIRCUITS WITH ANTENNAS
- Publication number 20210356511
- Publication date Nov 18, 2021
- Johnstech International Corporation
- Jeffrey Sherry
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT CONTACT TEST APPARATUS WITH AND METHOD OF CONSTR...
- Publication number 20210018533
- Publication date Jan 21, 2021
- Johnstech International Corporation
- Jeffrey Sherry
- G01 - MEASURING TESTING
Information Patent Application
Self Flattening Test Socket With Anti-Bowing And Elastomer Retention
- Publication number 20200400718
- Publication date Dec 24, 2020
- Johnstech International Corporation
- David T. Skodje
- G01 - MEASURING TESTING
Information Patent Application
Integrated Circuit Contactor For Testing ICs And Method Of Construc...
- Publication number 20200363451
- Publication date Nov 19, 2020
- Johnstech International Corporation
- John Nelson
- G01 - MEASURING TESTING
Information Patent Application
High Isolation Contactor with Test Pin and Housing For Integrated C...
- Publication number 20200313322
- Publication date Oct 1, 2020
- Johnstech International Corporation
- Jeffrey Sherry
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrically Conductive Kelvin Contacts For Microcircuit Tester
- Publication number 20190302145
- Publication date Oct 3, 2019
- Johnstech International Corporation
- Joel N. Erdman
- G01 - MEASURING TESTING
Information Patent Application
High Isolation Contactor with Test Pin and Housing For Integrated C...
- Publication number 20190097333
- Publication date Mar 28, 2019
- Johnstech International Corporation
- Jeffrey Sherry
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS AND METHOD FOR MICROCIRCUIT TESTING WITH CONICAL...
- Publication number 20190004093
- Publication date Jan 3, 2019
- Johnstech International Corporation
- John DeBauche
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins Microcircuit Tester
- Publication number 20190004091
- Publication date Jan 3, 2019
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins For Microcircuit Tester
- Publication number 20170315169
- Publication date Nov 2, 2017
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins Microcircuit Tester
- Publication number 20170276699
- Publication date Sep 28, 2017
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS AND METHOD FOR MICROCIRCUIT TESTING WITH CONICAL...
- Publication number 20170059616
- Publication date Mar 2, 2017
- Johnstech International Corporation
- John DeBauche
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Kelvin Contacts For Microcircuit Tester
- Publication number 20160320429
- Publication date Nov 3, 2016
- Johnstech International Corporation
- Joel N. Erdman
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins Microcircuit Tester
- Publication number 20160209444
- Publication date Jul 21, 2016
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins For Microcircuit Tester
- Publication number 20150123689
- Publication date May 7, 2015
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS AND METHOD FOR MICROCIRCUIT AND WAFER LEVEL IC TE...
- Publication number 20150015287
- Publication date Jan 15, 2015
- Johnstech International Corporation
- John DeBauche
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins For Microcircuit Tester
- Publication number 20140266279
- Publication date Sep 18, 2014
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Kelvin Contacts For Microcircuit Tester
- Publication number 20140103949
- Publication date Apr 17, 2014
- Joel N. Erdman
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins For Microcircuit Tester
- Publication number 20130271176
- Publication date Oct 17, 2013
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins For Microcircuit Tester
- Publication number 20130154678
- Publication date Jun 20, 2013
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Kelvin Contacts For Microcircuit Tester
- Publication number 20130099810
- Publication date Apr 25, 2013
- Johnstech International Corporation
- Joel N. Erdman
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins For Microcircuit Tester
- Publication number 20130002285
- Publication date Jan 3, 2013
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Test Contact System For Testing Integrated Circuits With Packages H...
- Publication number 20120176151
- Publication date Jul 12, 2012
- Johnstech International Corporation
- Jeffrey C. Sherry
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Kelvin Contacts For Microcircuit Tester
- Publication number 20120092034
- Publication date Apr 19, 2012
- Johnstech International Corporation
- Joel N. Erdman
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins For Microcircuit Tester
- Publication number 20120062261
- Publication date Mar 15, 2012
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Kelvin Contacts For Microcircuit Tester
- Publication number 20100264935
- Publication date Oct 21, 2010
- Joel N. Erdman
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins For Microcircuit Tester
- Publication number 20100231251
- Publication date Sep 16, 2010
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
MICROCIRCUIT TESTING INTERFACE HAVING KELVIN AND SIGNAL CONTACTS WI...
- Publication number 20100134119
- Publication date Jun 3, 2010
- Jeffrey C. Sherry
- G01 - MEASURING TESTING
Information Patent Application
Test Contact System For Testing Integrated Circuits With Packages H...
- Publication number 20090302878
- Publication date Dec 10, 2009
- Jeffrey C. Sherry
- G01 - MEASURING TESTING
Information Patent Application
CONTACT FOR USE IN TESTING INTEGRATED CIRCUITS
- Publication number 20080006103
- Publication date Jan 10, 2008
- Jeffrey C. Sherry
- G01 - MEASURING TESTING

Jeffrey C. Sherry

Person

Patents Grantslast 30 patents

Self flattening test socket with anti-bowing and elastomer retention

Integrated circuit contact test apparatus with and method of constr...

Waveguide integrated circuit testing

Waveguide integrated circuit testing

Integrated circuit testing for integrated circuits with antennas

Integrated circuit contactor for testing ICs and method of construc...

High isolation contactor with test pin and housing for integrated c...

High isolation housing for testing integrated circuits

Testing apparatus and method for microcircuit testing with conical...

Electrically conductive pins for microcircuit tester

Integrated circuit contact test apparatus with and method of constr...

Self flattening test socket with anti-bowing and elastomer retention

Integrated circuit contactor for testing ICs and method of construc...

Waveguide integrated testing

High isolation contactor with test pin and housing for integrated c...

Electrically conductive pins microcircuit tester

Waveguide integrated testing

Electrically conductive kelvin contacts for microcircuit tester

Resilient interposer with electrically conductive slide-by pins as...

Testing apparatus and method for microcircuit testing with conical...

Testing apparatus and method for microcircuit and wafer level IC te...

Electrically conductive pins for microcircuit tester

Electrically conductive pins for load boards lacking Kelvin capabil...

Electrically conductive kelvin contacts for microcircuit tester

Thermal management for microcircuit testing system

Electrically conductive Kelvin contacts for microcircuit tester

Electrically conductive pins for microcircuit tester

Electrically conductive pins for microcircuit tester

Electrically conductive kelvin contacts for microcircuit tester

Microcircuit tester with slideable electrically conductive pins

Patents Applicationslast 30 patents

INTEGRATED CIRCUIT TESTING FOR INTEGRATED CIRCUITS WITH ANTENNAS

INTEGRATED CIRCUIT CONTACT TEST APPARATUS WITH AND METHOD OF CONSTR...

Self Flattening Test Socket With Anti-Bowing And Elastomer Retention

Integrated Circuit Contactor For Testing ICs And Method Of Construc...

High Isolation Contactor with Test Pin and Housing For Integrated C...

Electrically Conductive Kelvin Contacts For Microcircuit Tester

High Isolation Contactor with Test Pin and Housing For Integrated C...

TESTING APPARATUS AND METHOD FOR MICROCIRCUIT TESTING WITH CONICAL...

Electrically Conductive Pins Microcircuit Tester

Electrically Conductive Pins For Microcircuit Tester

Electrically Conductive Pins Microcircuit Tester

TESTING APPARATUS AND METHOD FOR MICROCIRCUIT TESTING WITH CONICAL...

Electrically Conductive Kelvin Contacts For Microcircuit Tester

Electrically Conductive Pins Microcircuit Tester

Electrically Conductive Pins For Microcircuit Tester

TESTING APPARATUS AND METHOD FOR MICROCIRCUIT AND WAFER LEVEL IC TE...

Electrically Conductive Pins For Microcircuit Tester

Electrically Conductive Kelvin Contacts For Microcircuit Tester

Electrically Conductive Pins For Microcircuit Tester

Electrically Conductive Pins For Microcircuit Tester

Electrically Conductive Kelvin Contacts For Microcircuit Tester

Electrically Conductive Pins For Microcircuit Tester

Test Contact System For Testing Integrated Circuits With Packages H...

Electrically Conductive Kelvin Contacts For Microcircuit Tester

Electrically Conductive Pins For Microcircuit Tester

Electrically Conductive Kelvin Contacts For Microcircuit Tester

Electrically Conductive Pins For Microcircuit Tester

MICROCIRCUIT TESTING INTERFACE HAVING KELVIN AND SIGNAL CONTACTS WI...

Test Contact System For Testing Integrated Circuits With Packages H...

CONTACT FOR USE IN TESTING INTEGRATED CIRCUITS