Jeffrey Drue David

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Wafer bin map based root cause analysis
- Patent number 12,229,945
- Issue date Feb 18, 2025
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Abnormal wafer image classification
- Patent number 11,972,552
- Issue date Apr 30, 2024
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Grouping spectral data from polishing substrates
- Patent number 11,774,235
- Issue date Oct 3, 2023
- Applied Materials, Inc.
- Jeffrey Drue David
- G01 - MEASURING TESTING
Information Patent Grant
Wafer bin map based root cause analysis
- Patent number 11,763,446
- Issue date Sep 19, 2023
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Endpoint detection for chemical mechanical polishing based on spect...
- Patent number 11,715,672
- Issue date Aug 1, 2023
- Applied Materials, Inc.
- Dominic J. Benvegnu
- B24 - GRINDING POLISHING
Information Patent Grant
Anomalous equipment trace detection and classification
- Patent number 11,609,812
- Issue date Mar 21, 2023
- PDF Solutions, Inc.
- Richard Burch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Maintenance scheduling for semiconductor manufacturing equipment
- Patent number 11,295,993
- Issue date Apr 5, 2022
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Endpointing detection for chemical mechanical polishing based on sp...
- Patent number 11,183,435
- Issue date Nov 23, 2021
- Applied Materials, Inc.
- Dominic J. Benvegnu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Generating robust machine learning predictions for semiconductor ma...
- Patent number 11,029,673
- Issue date Jun 8, 2021
- PDF Solutions, Inc.
- Tomonori Honda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor yield prediction
- Patent number 11,022,642
- Issue date Jun 1, 2021
- PDF Solutions, Inc.
- Jeffrey Drue David
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Display of spectra contour plots versus time for semiconductor proc...
- Patent number 10,948,900
- Issue date Mar 16, 2021
- Applied Materials, Inc.
- Jeffrey Drue David
- B24 - GRINDING POLISHING
Information Patent Grant
Selective inclusion/exclusion of semiconductor chips in accelerated...
- Patent number 10,777,470
- Issue date Sep 15, 2020
- PDF Solutions, Inc.
- Lin Lee Cheong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spectra based endpointing for chemical mechanical polishing
- Patent number 10,766,119
- Issue date Sep 8, 2020
- Applied Materials, Inc.
- Boguslaw A. Swedek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process control techniques for semiconductor manufacturing processes
- Patent number 10,734,293
- Issue date Aug 4, 2020
- PDF Solutions, Inc.
- Jeffrey Drue David
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Polishing with measurement prior to deposition of outer layer
- Patent number 10,651,098
- Issue date May 12, 2020
- Applied Materials, Inc.
- Tomohiko Kitajima
- B24 - GRINDING POLISHING
Information Patent Grant
Process control techniques for semiconductor manufacturing processes
- Patent number 10,430,719
- Issue date Oct 1, 2019
- STREAM MOSAIC, INC.
- Jeffrey Drue David
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Endpointing detection for chemical mechanical polishing based on sp...
- Patent number 10,276,460
- Issue date Apr 30, 2019
- Applied Materials, Inc.
- Dominic J. Benvegnu
- B24 - GRINDING POLISHING
Information Patent Grant
Applying dimensional reduction to spectral data from polishing subs...
- Patent number 10,086,492
- Issue date Oct 2, 2018
- Applied Materials, Inc.
- Jeffrey Drue David
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Grouping spectral data from polishing substrates
- Patent number 10,012,494
- Issue date Jul 3, 2018
- Applied Materials, Inc.
- Jeffrey Drue David
- B24 - GRINDING POLISHING
Information Patent Grant
Endpoint method using peak location of spectra contour plots versus...
- Patent number 9,886,026
- Issue date Feb 6, 2018
- Applied Materials, Inc.
- Jeffrey Drue David
- B24 - GRINDING POLISHING
Information Patent Grant
Applying dimensional reduction to spectral data from polishing subs...
- Patent number 9,833,874
- Issue date Dec 5, 2017
- Applied Materials, Inc.
- Jeffrey Drue David
- B24 - GRINDING POLISHING
Information Patent Grant
Polishing with pre deposition spectrum
- Patent number 9,811,077
- Issue date Nov 7, 2017
- Applied Materials, Inc.
- Tomohiko Kitajima
- G05 - CONTROLLING REGULATING
Information Patent Grant
Dynamically tracking spectrum features for endpoint detection
- Patent number 9,649,743
- Issue date May 16, 2017
- Applied Materials, Inc.
- Jeffrey Drue David
- B24 - GRINDING POLISHING
Information Patent Grant
Endpointing detection for chemical mechanical polishing based on sp...
- Patent number 9,583,405
- Issue date Feb 28, 2017
- Applied Materials, Inc.
- Dominic J. Benvegnu
- B24 - GRINDING POLISHING
Information Patent Grant
Computer program product and method of controlling polishing of a s...
- Patent number 9,573,242
- Issue date Feb 21, 2017
- Applied Materials, Inc.
- Jeffrey Drue David
- B24 - GRINDING POLISHING
Information Patent Grant
Reducing noise in spectral data from polishing substrates
- Patent number 9,551,567
- Issue date Jan 24, 2017
- Applied Materials, Inc.
- Jeffrey Drue David
- B24 - GRINDING POLISHING
Information Patent Grant
Techniques for matching spectra
- Patent number 9,482,610
- Issue date Nov 1, 2016
- Applied Materials, Inc.
- Kiran Lall Shrestha
- B24 - GRINDING POLISHING
Information Patent Grant
Automatic initiation of reference spectra library generation for op...
- Patent number 9,372,116
- Issue date Jun 21, 2016
- Applied Materials, Inc.
- Jeffrey Drue David
- B24 - GRINDING POLISHING
Information Patent Grant
Polishing with eddy current feed meaurement prior to deposition of...
- Patent number 9,362,186
- Issue date Jun 7, 2016
- Applied Materials, Inc.
- Tomohiko Kitajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Serial feature tracking for endpoint detection
- Patent number 9,352,440
- Issue date May 31, 2016
- Applied Materials, Inc.
- Jeffrey Drue David
- B24 - GRINDING POLISHING

Patents Applicationslast 30 patents

Information Patent Application
Time-Series Segmentation and Anomaly Detection
- Publication number 20240184283
- Publication date Jun 6, 2024
- PDF Solutions, Inc.
- Tomonori Honda
- G05 - CONTROLLING REGULATING
Information Patent Application
Wafer Bin Map Based Root Cause Analysis
- Publication number 20230377132
- Publication date Nov 23, 2023
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ENDPOINT DETECTION FOR CHEMICAL MECHANICAL POLISHING BASED ON SPECT...
- Publication number 20220077006
- Publication date Mar 10, 2022
- Applied Materials, Inc.
- Dominic J. Benvegnu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sequenced Approach For Determining Wafer Path Quality
- Publication number 20220066410
- Publication date Mar 3, 2022
- PDF Solutions, Inc.
- Tomonori Honda
- G05 - CONTROLLING REGULATING
Information Patent Application
Wafer Bin Map Based Root Cause Analysis
- Publication number 20210342993
- Publication date Nov 4, 2021
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Abnormal Wafer Image Classification
- Publication number 20210334608
- Publication date Oct 28, 2021
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Collaborative Learning Model for Semiconductor Applications
- Publication number 20210142122
- Publication date May 13, 2021
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Anomalous Equipment Trace Detection and Classification
- Publication number 20210103489
- Publication date Apr 8, 2021
- PDF Solutions, Inc.
- Richard Burch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MAINTENANCE SCHEDULING FOR SEMICONDUCTOR MANUFACTURING EQUIPMENT
- Publication number 20200388545
- Publication date Dec 10, 2020
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELECTIVE INCLUSION/EXCLUSION OF SEMICONDUCTOR CHIPS IN ACCELERATED...
- Publication number 20190304849
- Publication date Oct 3, 2019
- STREAMMOSAIC, INC.
- Lin Lee Cheong
- G01 - MEASURING TESTING
Information Patent Application
ENDPOINTING DETECTION FOR CHEMICAL MECHANICAL POLISHING BASED ON SP...
- Publication number 20190252274
- Publication date Aug 15, 2019
- Applied Materials, Inc.
- Dominic J. Benvegnu
- B24 - GRINDING POLISHING
Information Patent Application
SEMICONDUCTOR YIELD PREDICTION
- Publication number 20190064253
- Publication date Feb 28, 2019
- STREAMMOSAIC, INC.
- Jeffrey Drue David
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERATING ROBUST MACHINE LEARNING PREDICTIONS FOR SEMICONDUCTOR MA...
- Publication number 20180356807
- Publication date Dec 13, 2018
- STREAMMOSAIC, INC.
- Tomonori Honda
- G05 - CONTROLLING REGULATING
Information Patent Application
PROCESS CONTROL TECHNIQUES FOR SEMICONDUCTOR MANUFACTURING PROCESSES
- Publication number 20180358271
- Publication date Dec 13, 2018
- STREAM MOSAIC, INC.
- Jeffrey Drue DAVID
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Grouping Spectral Data From Polishing Substrates
- Publication number 20180321026
- Publication date Nov 8, 2018
- Applied Materials, Inc.
- Jeffrey Drue David
- B24 - GRINDING POLISHING
Information Patent Application
Display of Spectra Contour Plots Versus Time For Semiconductor Proc...
- Publication number 20180113440
- Publication date Apr 26, 2018
- Applied Materials, Inc.
- Jeffrey Drue David
- B24 - GRINDING POLISHING
Information Patent Application
APPLYING DIMENSIONAL REDUCTION TO SPECTRAL DATA FROM POLISHING SUBS...
- Publication number 20180071886
- Publication date Mar 15, 2018
- Applied Materials, Inc.
- Jeffrey Drue David
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENDPOINTING DETECTION FOR CHEMICAL MECHANICAL POLISHING BASED ON SP...
- Publication number 20170125313
- Publication date May 4, 2017
- Applied Materials, Inc.
- Dominic J. Benvegnu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPLYING DIMENSIONAL REDUCTION TO SPECTRAL DATA FROM POLISHING SUBS...
- Publication number 20170113320
- Publication date Apr 27, 2017
- Applied Materials, Inc.
- Jeffrey Drue David
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESS CONTROL TECHNIQUES FOR SEMICONDUCTOR MANUFACTURING PROCESSES
- Publication number 20170109646
- Publication date Apr 20, 2017
- STREAM MOSAIC, INC.
- Jeffrey Drue DAVID
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POLISHING WITH MEASUREMENT PRIOR TO DEPOSITION OF OUTER LAYER
- Publication number 20160284615
- Publication date Sep 29, 2016
- Applied Materials, Inc.
- Tomohiko Kitajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESS CONTROL TECHNIQUES FOR SEMICONDUCTOR MANUFACTURING PROCESSES
- Publication number 20160148850
- Publication date May 26, 2016
- STREAM MOSAIC, INC.
- Jeffrey Drue DAVID
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dynamically Tracking Spectrum Features For Endpoint Detection
- Publication number 20160129550
- Publication date May 12, 2016
- Applied Materials, Inc.
- Jeffrey Drue David
- G01 - MEASURING TESTING
Information Patent Application
Multi-Platen Multi-Head Polishing Architecture
- Publication number 20160101497
- Publication date Apr 14, 2016
- Applied Materials, Inc.
- Jeffrey Drue David
- B24 - GRINDING POLISHING
Information Patent Application
POLISHING WITH PRE DEPOSITION SPECTRUM
- Publication number 20160018815
- Publication date Jan 21, 2016
- Applied Materials, Inc.
- Tomohiko Kitajima
- G05 - CONTROLLING REGULATING
Information Patent Application
POLISHING WITH EDDY CURRENT FEED MEAUREMENT PRIOR TO DEPOSITION OF...
- Publication number 20160020157
- Publication date Jan 21, 2016
- Tomohiko Kitajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENDPOINTING DETECTION FOR CHEMICAL MECHANICAL POLISHING BASED ON SP...
- Publication number 20150364390
- Publication date Dec 17, 2015
- Applied Materials, Inc.
- Dominic J. Benvegnu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SERIAL FEATURE TRACKING FOR ENDPOINT DETECTION
- Publication number 20150314415
- Publication date Nov 5, 2015
- APPLIED MATERIALS, INC.
- Jeffrey Drue David
- B24 - GRINDING POLISHING
Information Patent Application
Polishing System with Front Side Pressure Control
- Publication number 20150298284
- Publication date Oct 22, 2015
- Applied Materials, Inc.
- Jeffrey Drue David
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENDPOINT METHOD USING PEAK LOCATION OF SPECTRA CONTOUR PLOTS VERSUS...
- Publication number 20150160649
- Publication date Jun 11, 2015
- Applied Materials, Inc.
- Jeffrey Drue David
- G05 - CONTROLLING REGULATING

Jeffrey Drue David

Person

Patents Grantslast 30 patents

Wafer bin map based root cause analysis

Abnormal wafer image classification

Grouping spectral data from polishing substrates

Wafer bin map based root cause analysis

Endpoint detection for chemical mechanical polishing based on spect...

Anomalous equipment trace detection and classification

Maintenance scheduling for semiconductor manufacturing equipment

Endpointing detection for chemical mechanical polishing based on sp...

Generating robust machine learning predictions for semiconductor ma...

Semiconductor yield prediction

Display of spectra contour plots versus time for semiconductor proc...

Selective inclusion/exclusion of semiconductor chips in accelerated...

Spectra based endpointing for chemical mechanical polishing

Process control techniques for semiconductor manufacturing processes

Polishing with measurement prior to deposition of outer layer

Process control techniques for semiconductor manufacturing processes

Endpointing detection for chemical mechanical polishing based on sp...

Applying dimensional reduction to spectral data from polishing subs...

Grouping spectral data from polishing substrates

Endpoint method using peak location of spectra contour plots versus...

Applying dimensional reduction to spectral data from polishing subs...

Polishing with pre deposition spectrum

Dynamically tracking spectrum features for endpoint detection

Endpointing detection for chemical mechanical polishing based on sp...

Computer program product and method of controlling polishing of a s...

Reducing noise in spectral data from polishing substrates

Techniques for matching spectra

Automatic initiation of reference spectra library generation for op...

Polishing with eddy current feed meaurement prior to deposition of...

Serial feature tracking for endpoint detection

Patents Applicationslast 30 patents

Time-Series Segmentation and Anomaly Detection

Wafer Bin Map Based Root Cause Analysis

ENDPOINT DETECTION FOR CHEMICAL MECHANICAL POLISHING BASED ON SPECT...

Sequenced Approach For Determining Wafer Path Quality

Wafer Bin Map Based Root Cause Analysis

Abnormal Wafer Image Classification

Collaborative Learning Model for Semiconductor Applications

Anomalous Equipment Trace Detection and Classification

MAINTENANCE SCHEDULING FOR SEMICONDUCTOR MANUFACTURING EQUIPMENT

SELECTIVE INCLUSION/EXCLUSION OF SEMICONDUCTOR CHIPS IN ACCELERATED...

ENDPOINTING DETECTION FOR CHEMICAL MECHANICAL POLISHING BASED ON SP...

SEMICONDUCTOR YIELD PREDICTION

GENERATING ROBUST MACHINE LEARNING PREDICTIONS FOR SEMICONDUCTOR MA...

PROCESS CONTROL TECHNIQUES FOR SEMICONDUCTOR MANUFACTURING PROCESSES

Grouping Spectral Data From Polishing Substrates

Display of Spectra Contour Plots Versus Time For Semiconductor Proc...

APPLYING DIMENSIONAL REDUCTION TO SPECTRAL DATA FROM POLISHING SUBS...

ENDPOINTING DETECTION FOR CHEMICAL MECHANICAL POLISHING BASED ON SP...

APPLYING DIMENSIONAL REDUCTION TO SPECTRAL DATA FROM POLISHING SUBS...

PROCESS CONTROL TECHNIQUES FOR SEMICONDUCTOR MANUFACTURING PROCESSES

POLISHING WITH MEASUREMENT PRIOR TO DEPOSITION OF OUTER LAYER

PROCESS CONTROL TECHNIQUES FOR SEMICONDUCTOR MANUFACTURING PROCESSES

Dynamically Tracking Spectrum Features For Endpoint Detection

Multi-Platen Multi-Head Polishing Architecture

POLISHING WITH PRE DEPOSITION SPECTRUM

POLISHING WITH EDDY CURRENT FEED MEAUREMENT PRIOR TO DEPOSITION OF...

ENDPOINTING DETECTION FOR CHEMICAL MECHANICAL POLISHING BASED ON SP...

SERIAL FEATURE TRACKING FOR ENDPOINT DETECTION

Polishing System with Front Side Pressure Control

ENDPOINT METHOD USING PEAK LOCATION OF SPECTRA CONTOUR PLOTS VERSUS...