Jeffrey E. McAninch

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Livermore, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Measurement system with separate optimized beam paths
- Patent number 7,227,637
- Issue date Jun 5, 2007
- Therma-Wave, Inc.
- David Y. Wang
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system with separate optimized beam paths
- Patent number 7,061,614
- Issue date Jun 13, 2006
- Therma-Wave, Inc.
- David Y. Wang
- G01 - MEASURING TESTING
Information Patent Grant
Purge system for optical metrology tool
- Patent number 6,813,026
- Issue date Nov 2, 2004
- Therma-Wave, Inc.
- Jeffrey E. McAninch
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Measurement system with separate optimized beam paths
- Publication number 20060180761
- Publication date Aug 17, 2006
- David Y. Wang
- G01 - MEASURING TESTING
Information Patent Application
Measurement system with separate optimized beam paths
- Publication number 20030071996
- Publication date Apr 17, 2003
- David Y. Wang
- G01 - MEASURING TESTING
Information Patent Application
Purge system for optical metrology tool
- Publication number 20020149774
- Publication date Oct 17, 2002
- Jeffrey E. McAninch
- G01 - MEASURING TESTING