Jeffrey Hirsch

Person

  • Madison, WI, US

Patents Grantslast 30 patents

  • Information Patent Grant

    Multi-mode sampling probes

    • Patent number 7,359,060
    • Issue date Apr 15, 2008
    • Thermo Electron Scientific Instruments LLC
    • Matthew D. Ebersole
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Multi-mode sampling probes

    • Publication number 20070103690
    • Publication date May 10, 2007
    • Matthew D. Ebersole
    • G01 - MEASURING TESTING