Jeffrey John Haeffele

Person

Monument, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Oscilloscope probe having probe identification module
- Patent number 12,287,354
- Issue date Apr 29, 2025
- Keysight Technologies, Inc.
- Paul Doyle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Oscilloscope probe identification
- Patent number 11,287,445
- Issue date Mar 29, 2022
- Keysight Technologies, Inc.
- Paul Doyle
- G01 - MEASURING TESTING
Information Patent Grant
High resolution time stamps for periodic samples
- Patent number 7,545,848
- Issue date Jun 9, 2009
- Agilent Technologies, Inc.
- Jeffrey John Haeffele
- G01 - MEASURING TESTING
Information Patent Grant
Composite eye diagrams
- Patent number 6,810,346
- Issue date Oct 26, 2004
- Agilent Technologies, Inc.
- Richard A Nygaard
- G01 - MEASURING TESTING
Information Patent Grant
System and method for allocating logic analyzer hardware resources
- Patent number 6,789,217
- Issue date Sep 7, 2004
- Agilent Technologies, Inc.
- Chad H Slaugh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Identification of channels and associated signal information contri...
- Patent number 6,668,235
- Issue date Dec 23, 2003
- Agilent Technologies, Inc.
- Richard A Nygaard
- G01 - MEASURING TESTING
Information Patent Grant
Integrated trigger function display system and methodology for trig...
- Patent number 6,396,517
- Issue date May 28, 2002
- Agilent Technologies, Inc.
- Douglas James Beck
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Switched row/column memory redundancy
- Patent number 5,255,227
- Issue date Oct 19, 1993
- Hewlett-Packard Company
- Jeffrey J. Haeffele
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
OSCILLOSCOPE PROBE
- Publication number 20220128601
- Publication date Apr 28, 2022
- KEYSIGHT TECHNOLOGIES, INC.
- Paul Doyle
- G01 - MEASURING TESTING
Information Patent Application
OSCILLOSCOPE PROBE
- Publication number 20200132722
- Publication date Apr 30, 2020
- KEYSIGHT TECHNOLOGIES, INC.
- Paul Doyle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
High resolution time stamps for periodic samples
- Publication number 20070104303
- Publication date May 10, 2007
- Jeffrey John Haeffele
- G01 - MEASURING TESTING
Information Patent Application
Continuously retraining sampler and method of use thereof
- Publication number 20040239376
- Publication date Dec 2, 2004
- Jeffrey John Haeffele
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Identification of channels and associated signal information contri...
- Publication number 20030187620
- Publication date Oct 2, 2003
- Richard A. Nygaard
- G01 - MEASURING TESTING
Information Patent Application
Composite eye diagrams
- Publication number 20030158687
- Publication date Aug 21, 2003
- Richard A. Nygaard
- G01 - MEASURING TESTING
Information Patent Application
System and method for allocating logic analyzer hardware resources
- Publication number 20020147943
- Publication date Oct 10, 2002
- Chad H. Slaugh
- G06 - COMPUTING CALCULATING COUNTING

Jeffrey John Haeffele

Person

Patents Grantslast 30 patents

Oscilloscope probe having probe identification module

Oscilloscope probe identification

High resolution time stamps for periodic samples

Composite eye diagrams

System and method for allocating logic analyzer hardware resources

Identification of channels and associated signal information contri...

Integrated trigger function display system and methodology for trig...

Switched row/column memory redundancy

Patents Applicationslast 30 patents

OSCILLOSCOPE PROBE

OSCILLOSCOPE PROBE

High resolution time stamps for periodic samples

Continuously retraining sampler and method of use thereof

Identification of channels and associated signal information contri...

Composite eye diagrams

System and method for allocating logic analyzer hardware resources