Jeffrey Kessenich

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Memory devices configured to perform leak checks
- Patent number 10,665,307
- Issue date May 26, 2020
- Micron Technology, Inc.
- Jeffrey A. Kessenich
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory devices configured to perform leak checks
- Patent number 10,366,767
- Issue date Jul 30, 2019
- Micron Technology, Inc.
- Jeffrey A. Kessenich
- G01 - MEASURING TESTING
Information Patent Grant
Program operations with embedded leak checks
- Patent number 9,281,078
- Issue date Mar 8, 2016
- Micron Technology, Inc.
- Jeffrey A. Kessenich
- G11 - INFORMATION STORAGE
Information Patent Grant
Multiple level program verify in a memory device
- Patent number 8,717,823
- Issue date May 6, 2014
- Micron Technology, Inc.
- Taehoon Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Multiple level program verify in a memory device
- Patent number 8,223,555
- Issue date Jul 17, 2012
- Micron Technology, Inc.
- Taehoon Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Program-verify method
- Patent number 7,952,936
- Issue date May 31, 2011
- Micron Technology, Inc.
- Andrei Mihnea
- G11 - INFORMATION STORAGE
Information Patent Grant
Program-verify method with different read and verify pass-through v...
- Patent number 7,619,931
- Issue date Nov 17, 2009
- Micron Technology, Inc.
- Andrei Mihnea
- G11 - INFORMATION STORAGE
Information Patent Grant
Flash memory device with improved programming performance
- Patent number 7,280,403
- Issue date Oct 9, 2007
- Micron Technology, Inc.
- Jeffrey Alan Kessenich
- G11 - INFORMATION STORAGE
Information Patent Grant
Flash memory device with improved programming performance
- Patent number 7,120,055
- Issue date Oct 10, 2006
- Micron Technology, Inc.
- Jeffrey Alan Kessenich
- G11 - INFORMATION STORAGE
Information Patent Grant
Flash memory device with improved programming performance
- Patent number 7,038,945
- Issue date May 2, 2006
- Micron Technology, Inc.
- Jeffrey Alan Kessenich
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method of testing non-volatile memory cells
- Patent number 6,684,173
- Issue date Jan 27, 2004
- Micron Technology, Inc.
- Jeffrey Alan Kessenich
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of reducing trapped holes induced by erase operations in the...
- Patent number 6,493,280
- Issue date Dec 10, 2002
- Micron Technology, Inc.
- Andrei Mihnea
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of reducing trapped holes induced by erase operations in the...
- Patent number 6,426,898
- Issue date Jul 30, 2002
- Micron Technology, Inc.
- Andrei Mihnea
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
MEMORY DEVICES CONFIGURED TO PERFORM LEAK CHECKS
- Publication number 20190287634
- Publication date Sep 19, 2019
- Micron Technology, Inc.
- Jeffrey A. Kessenich
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICES CONFIGURED TO PERFORM LEAK CHECKS
- Publication number 20170352431
- Publication date Dec 7, 2017
- Micron Technology, Inc.
- Jeffrey A. Kessenich
- G01 - MEASURING TESTING
Information Patent Application
PROGRAM OPERATIONS WITH EMBEDDED LEAK CHECKS
- Publication number 20150364213
- Publication date Dec 17, 2015
- Micron Technology, Inc.
- Jeffrey A. Kessenich
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE LEVEL PROGRAM VERIFY IN A MEMORY DEVICE
- Publication number 20120269004
- Publication date Oct 25, 2012
- Micron Technology, Inc.
- Taehoon Kim
- G11 - INFORMATION STORAGE
Information Patent Application
MULTIPLE LEVEL PROGRAM VERIFY IN A MEMORY DEVICE
- Publication number 20100284219
- Publication date Nov 11, 2010
- Micron Technology, Inc.
- Taehoon Kim
- G11 - INFORMATION STORAGE
Information Patent Application
PROGRAM-VERIFY METHOD
- Publication number 20100046303
- Publication date Feb 25, 2010
- Micron Technology, Inc.
- Andrei Mihnea
- G11 - INFORMATION STORAGE
Information Patent Application
Program-verify method
- Publication number 20090003078
- Publication date Jan 1, 2009
- Micron Technology, Inc.
- Andrei Mihnea
- G11 - INFORMATION STORAGE
Information Patent Application
Flash memory device with improved programming performance
- Publication number 20070014158
- Publication date Jan 18, 2007
- Micron Technology, Inc.
- Jeffrey Alan Kessenich
- G11 - INFORMATION STORAGE
Information Patent Application
Flash memory device with improved programming performance
- Publication number 20060146611
- Publication date Jul 6, 2006
- Micron Technology, Inc.
- Jeffrey Alan Kessenich
- G11 - INFORMATION STORAGE
Information Patent Application
Flash memory device with improved programming performance
- Publication number 20050248990
- Publication date Nov 10, 2005
- Micron Technology, Inc.
- Jeffrey Alan Kessenich
- G11 - INFORMATION STORAGE
Information Patent Application
System and method of testing non-volatile memory cells
- Publication number 20030074152
- Publication date Apr 17, 2003
- Jeffrey Alan Kessenich
- G11 - INFORMATION STORAGE
Information Patent Application
Method of reducing trapped holes induced by erase operations in the...
- Publication number 20020121653
- Publication date Sep 5, 2002
- Andrei Mihnea
- G11 - INFORMATION STORAGE

Jeffrey Kessenich

Person

Patents Grantslast 30 patents

Memory devices configured to perform leak checks

Memory devices configured to perform leak checks

Program operations with embedded leak checks

Multiple level program verify in a memory device

Multiple level program verify in a memory device

Program-verify method

Program-verify method with different read and verify pass-through v...

Flash memory device with improved programming performance

Flash memory device with improved programming performance

Flash memory device with improved programming performance

System and method of testing non-volatile memory cells

Method of reducing trapped holes induced by erase operations in the...

Method of reducing trapped holes induced by erase operations in the...

Patents Applicationslast 30 patents

MEMORY DEVICES CONFIGURED TO PERFORM LEAK CHECKS

MEMORY DEVICES CONFIGURED TO PERFORM LEAK CHECKS

PROGRAM OPERATIONS WITH EMBEDDED LEAK CHECKS

MULTIPLE LEVEL PROGRAM VERIFY IN A MEMORY DEVICE

MULTIPLE LEVEL PROGRAM VERIFY IN A MEMORY DEVICE

PROGRAM-VERIFY METHOD

Program-verify method

Flash memory device with improved programming performance

Flash memory device with improved programming performance

Flash memory device with improved programming performance

System and method of testing non-volatile memory cells

Method of reducing trapped holes induced by erase operations in the...