Jeffrey Lee VanOss

Person

  • Holland, MI, US

Patents Grantslast 30 patents

  • Information Patent Grant

    Spatial tracking system and method

    • Patent number 8,866,495
    • Issue date Oct 21, 2014
    • Access Business Group International LLC
    • David W. Baarman
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    SPATIAL TRACKING SYSTEM AND METHOD

    • Publication number 20120001644
    • Publication date Jan 5, 2012
    • Access Business Group International LLC
    • David W. Baarman
    • G01 - MEASURING TESTING