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Jeffrey Loewecke
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Wylie, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Divergent charged particle implantation for improved transistor sym...
Patent number
7,807,978
Issue date
Oct 5, 2010
Texas Instruments Incorporated
James D. Bernstein
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for implanter angle verification and calibration
Patent number
7,397,046
Issue date
Jul 8, 2008
Texas Instruments Incorporated
Duofeng Yue
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Divergent charged particle implantation for improved transistor sym...
Patent number
7,385,202
Issue date
Jun 10, 2008
Texas Instruments Incorporated
James D. Bernstein
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for implanting dopants within a substrate by tilting the sub...
Patent number
7,232,744
Issue date
Jun 19, 2007
Texas Instruments Incorporated
Said Ghneim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for varying the uniformity of a dopant as it is placed in a...
Patent number
7,208,330
Issue date
Apr 24, 2007
Texas Instruments Incorporated
Sean M. Collins
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for improving a drive current for semiconductor devices on a...
Patent number
7,153,711
Issue date
Dec 26, 2006
Texas Instruments Incorporated
James B. Friedmann
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
DIVERGENT CHARGED PARTICLE IMPLANTATION FOR IMPROVED TRANSISTOR SYM...
Publication number
20080206971
Publication date
Aug 28, 2008
TEXAS INSTRUMENTS INCORPORATED
James D. Bernstein
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Divergent Charged Particle Implantation for Improved Transistor Sym...
Publication number
20080142724
Publication date
Jun 19, 2008
TEXAS INSTRUMENTS INCORPORATED
James D. Bernstein
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for varying the uniformity of a dopant as it is placed in a...
Publication number
20060154457
Publication date
Jul 13, 2006
Texas Instruments, Inc.
Sean M. Collins
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for implanter angle verification and calibration
Publication number
20060138355
Publication date
Jun 29, 2006
TEXAS INSTRUMENTS INCORPORATED
Duofeng Yue
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Divergent charged particle implantation for improved transistor sym...
Publication number
20060121706
Publication date
Jun 8, 2006
Texas Instruments, Inc.
James D. Bernstein
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for implanting dopants within a substrate by tilting the sub...
Publication number
20060073685
Publication date
Apr 6, 2006
TEXAS INSTRUMENTS INCORPORATED
Said Ghneim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for improving a drive current for semiconductor devices on a...
Publication number
20060035394
Publication date
Feb 16, 2006
Texas Instruments, Incorporated
James B. Friedmann
H01 - BASIC ELECTRIC ELEMENTS