Jeffrey M. Johnston

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Palm Bay, FL, US

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Patents Grantslast 30 patents

Information Patent Grant
Body contact layouts for semiconductor structures
- Patent number 10,665,676
- Issue date May 26, 2020
- Intersil Americas LLC
- Dev Alok Girdhar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming body contact layouts for semiconductor structures
- Patent number 9,960,236
- Issue date May 1, 2018
- Intersil Americas LLC
- Dev Alok Girdhar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Body contact layouts for semiconductor structures
- Patent number 9,536,952
- Issue date Jan 3, 2017
- Intersil Americas LLC
- Dev Alok Girdhar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analog-to-digital converter and method of fabrication
- Patent number 6,329,260
- Issue date Dec 11, 2001
- Intersil Americas Inc.
- Glenn Alan DeJong
- G05 - CONTROLLING REGULATING
Information Patent Grant
Analog-to-digital converter and method of fabrication
- Patent number 5,994,755
- Issue date Nov 30, 1999
- Intersil Corporation
- Glenn Alan DeJong
- G05 - CONTROLLING REGULATING
Information Patent Grant
Analog-to-digital converter
- Patent number 5,481,129
- Issue date Jan 2, 1996
- Harris Corporation
- Glenn A. DeJong
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
BODY CONTACT LAYOUTS FOR SEMICONDUCTOR STRUCTURES
- Publication number 20180248006
- Publication date Aug 30, 2018
- Renesas Electronics America Inc.
- Dev Alok GIRDHAR
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BODY CONTACT LAYOUTS FOR SEMICONDUCTOR STRUCTURES
- Publication number 20170069719
- Publication date Mar 9, 2017
- INTERSIL AMERICAS LLC
- Dev Alok Girdhar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BODY CONTACT LAYOUTS FOR SEMICONDUCTOR STRUCTURES
- Publication number 20150325652
- Publication date Nov 12, 2015
- INTERSIL AMERICAS LLC
- Dev Alok Girdhar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor test system and associated methods for wafer level ac...
- Publication number 20030006413
- Publication date Jan 9, 2003
- University of Florida
- Ravi Chawla
- G01 - MEASURING TESTING