Jeffrey M. Moser

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Oakland, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Grain inspection and analysis apparatus and method
- Patent number 5,917,927
- Issue date Jun 29, 1999
- Satake Corporation
- Satoru Satake
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dual-wavelength low-power built-in-test for a laser-initiated ordna...
- Patent number 5,359,192
- Issue date Oct 25, 1994
- Quantic Industries Inc.
- Michael S. Williams
- F42 - AMMUNITION BLASTING
Information Patent Grant
Laser initiated ordnance systems
- Patent number 5,206,455
- Issue date Apr 27, 1993
- Quantic Industries, Inc.
- Michael S. Williams
- F42 - AMMUNITION BLASTING