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Jeffrey Oicles
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San Diego, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Very narrow band, two chamber, high rep-rate gas discharge laser sy...
Patent number
7,567,607
Issue date
Jul 28, 2009
Cymer, Inc.
David S. Knowles
G01 - MEASURING TESTING
Information
Patent Grant
High voltage pulse generator
Patent number
7,209,373
Issue date
Apr 24, 2007
Kaiser Systems, Inc.
Jeffrey Alan Oicles
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Very narrow band, two chamber, high rep-rate gas discharge laser sy...
Patent number
7,061,961
Issue date
Jun 13, 2006
Cymer, Inc.
David S. Knowles
G01 - MEASURING TESTING
Information
Patent Grant
Very narrow band, two chamber, high reprate gas discharge laser system
Patent number
6,985,508
Issue date
Jan 10, 2006
Cymer, Inc.
David S. Knowles
G01 - MEASURING TESTING
Information
Patent Grant
Very narrow band, two chamber, high rep rate gas discharge laser sy...
Patent number
6,625,191
Issue date
Sep 23, 2003
Cymer, Inc.
David S. Knowles
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
High voltage pulse generator
Publication number
20060139977
Publication date
Jun 29, 2006
KAISER SYSTEMS, INC.
Jeffrey Alan Oicles
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Application
Very narrow band, two chamber, high rep-rate gas discharge laser sy...
Publication number
20060126697
Publication date
Jun 15, 2006
Cymer, Inc.
David S. Knowles
G01 - MEASURING TESTING
Information
Patent Application
VERY NARROW BAND, TWO CHAMBER, HIGH REP-RATE GAS DISCHARGE LASER SY...
Publication number
20050271109
Publication date
Dec 8, 2005
Cymer, Inc.
David S. Knowles
G01 - MEASURING TESTING
Information
Patent Application
Very narrow band, two chamber, high reprate gas discharge laser system
Publication number
20040047385
Publication date
Mar 11, 2004
David S. Knowles
G01 - MEASURING TESTING
Information
Patent Application
Very narrow band, two chamber, high rep rate gas discharge laser sy...
Publication number
20020154668
Publication date
Oct 24, 2002
David S. Knowles
G01 - MEASURING TESTING