Jeffrey Reichert

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for defect localization
- Patent number 6,664,541
- Issue date Dec 16, 2003
- KLA-Tencor Technologies Corporation
- Mehran Nasser-Ghodsi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Methods and apparatus for defect localization
- Publication number 20030062477
- Publication date Apr 3, 2003
- KLA-Tencor Technologies Corporation
- Mehran Nasser-Ghodsi
- G01 - MEASURING TESTING