Jeffrey Rzepiela

Follow

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for controlling deposition of a charge on a waf...
- Patent number 7,893,703
- Issue date Feb 22, 2011
- KLA-Tencor Technologies Corp.
- Jeffrey A. Rzepiela
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining one or more properties of a spe...
- Patent number 7,187,186
- Issue date Mar 6, 2007
- KLA-Tencor Technologies Corp.
- Jianou Shi
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for using non-contact voltage sensors and coron...
- Patent number 7,110,238
- Issue date Sep 19, 2006
- KLA-Tencor Technologies Corp.
- Zhiwei (Steve) Xu
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for using non-contact voltage sensors and coron...
- Patent number 6,909,291
- Issue date Jun 21, 2005
- KLA-Tencor Technologies Corp.
- Zhiwei (Steve) Xu
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection system
- Patent number 6,862,096
- Issue date Mar 1, 2005
- KLA-Tencor Corporation
- Mehdi Vaez-Iravani
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection system
- Patent number 6,538,730
- Issue date Mar 25, 2003
- KLA-Tencor Technologies Corporation
- Mehdi Vaez-Iravani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR DETERMINING ONE OR MORE PROPERTIES OF A SPE...
- Publication number 20070126458
- Publication date Jun 7, 2007
- Jianou Shi
- G01 - MEASURING TESTING
Information Patent Application
Test Pads, Methods and Systems for Measuring Properties of a Wafer
- Publication number 20070109003
- Publication date May 17, 2007
- KLA-TENCOR TECHNOLOGIES CORP.
- Jianou Shi
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Controlling Deposition of a Charge on a Waf...
- Publication number 20070069759
- Publication date Mar 29, 2007
- KLA-TENCOR TECHNOLOGIES CORP.
- Jeffrey A. Rzepiela
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for determining one or more properties of a spe...
- Publication number 20050206402
- Publication date Sep 22, 2005
- Jianou Shi
- G01 - MEASURING TESTING
Information Patent Application
Defect detection system
- Publication number 20050018181
- Publication date Jan 27, 2005
- Mehdi Vaez-Iravani
- G01 - MEASURING TESTING
Information Patent Application
Defect detection system
- Publication number 20030210393
- Publication date Nov 13, 2003
- KLA-Tencor Corporation
- Mehdi Vaez-Iravani
- G01 - MEASURING TESTING
Information Patent Application
Defect detection system
- Publication number 20020145732
- Publication date Oct 10, 2002
- Mehdi Vaez-Iravani
- G01 - MEASURING TESTING