Jeffrey S. McMurray

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Wappingers Falls, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Particle emission analysis for semiconductor fabrication steps
- Patent number 8,158,449
- Issue date Apr 17, 2012
- International Business Machines Corporation
- Cyril Cabral, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Transmission electron microscopy sample preparation method for elec...
- Patent number 7,214,935
- Issue date May 8, 2007
- International Business Machines Corporation
- Thomas A. Bauer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PARTICLE EMISSION ANALYSIS FOR SEMICONDUCTOR FABRICATION STEPS
- Publication number 20100084656
- Publication date Apr 8, 2010
- Cyril Cabral, JR.
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSION ELECTRON MICROSCOPY SAMPLE PREPARATION METHOD FOR ELEC...
- Publication number 20060065830
- Publication date Mar 30, 2006
- International Business Machines Corporation
- Thomas A. Bauer
- G01 - MEASURING TESTING