Membership
Tour
Register
Log in
Jeffrey S. White
Follow
Person
Manchester, MI, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
System for determining at least one property of a sheet dielectric...
Patent number
10,215,696
Issue date
Feb 26, 2019
Picometrix, LLC
David Zimdars
G01 - MEASURING TESTING
Information
Patent Grant
System and method for detection and measurement of interfacial prop...
Patent number
9,588,041
Issue date
Mar 7, 2017
Picometrix, LLC
Jeffrey S. White
G01 - MEASURING TESTING
Information
Patent Grant
System for calculation of material properties using reflection tera...
Patent number
9,360,296
Issue date
Jun 7, 2016
Picometrix, LLC
Jeffrey S. White
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
System and method to measure the transit time position(s) of pulses...
Patent number
8,457,915
Issue date
Jun 4, 2013
Picometrix, LLC
Jeffrey S. White
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM FOR DETERMINING AT LEAST ONE PROPERTY OF A SHEET DIELECTRIC...
Publication number
20170023469
Publication date
Jan 26, 2017
PICOMETRIX, LLC
David Zimdars
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR CALCULATION OF MATERIAL PROPERTIES USING REFLECTION TERA...
Publication number
20150268030
Publication date
Sep 24, 2015
PICOMETRIX, LLC
Jeffrey S. White
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR DETECTION AND MEASUREMENT OF INTERFACIAL PROP...
Publication number
20120304756
Publication date
Dec 6, 2012
PICOMETRIX, LLC
Jeffrey S. White
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD TO MEASURE THE TRANSIT TIME POSITION(S) OF PULSES...
Publication number
20100280779
Publication date
Nov 4, 2010
Jeffrey S. White
G01 - MEASURING TESTING