Jeffrey S. Zimmerman

Person

Swanton, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Post-production substrate modification with FIB deposition
- Patent number 11,139,217
- Issue date Oct 5, 2021
- BAE Systems Information and Electronic Systems Integration Inc.
- Jeffrey A. Zimmerman
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Method for enhanced semiconductor product diagnostic fail signature...
- Patent number 10,101,388
- Issue date Oct 16, 2018
- International Business Machines Corporation
- Robert C. Redburn
- G01 - MEASURING TESTING
Information Patent Grant
Structure, semiconductor structure and method of manufacturing a se...
- Patent number 9,000,585
- Issue date Apr 7, 2015
- International Business Machines Corporation
- Timothy H. Daubenspeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Protection of one-time programmable (OTP) memory
- Patent number 8,990,478
- Issue date Mar 24, 2015
- International Business Machines Corporation
- John A. Fifield
- G11 - INFORMATION STORAGE
Information Patent Grant
Structure, semiconductor structure and method of manufacturing a se...
- Patent number 8,114,767
- Issue date Feb 14, 2012
- International Business Machines Corporation
- Timothy H. Daubenspeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure, failure analysis tool and method of determining white bu...
- Patent number 7,958,477
- Issue date Jun 7, 2011
- International Business Machines Corporation
- Timothy H. Daubenspeck
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sensor, method, and design structure for a low-k delamination sensor
- Patent number 7,716,992
- Issue date May 18, 2010
- International Business Machines Corporation
- John J. Maloney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determining allowance antenna area as function of total gate insula...
- Patent number 7,712,057
- Issue date May 4, 2010
- International Business Machines Corporation
- Henry A. Bonges
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Suppression of localized metal precipitate formation and correspond...
- Patent number 7,649,262
- Issue date Jan 19, 2010
- International Business Machines Corporation
- Jonathan D. Chapple-Sokol
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Suppression of localized metal precipitate formation and correspond...
- Patent number 7,572,650
- Issue date Aug 11, 2009
- International Business Machnines Corporation
- Jonathan D. Chapple-Sokol
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of assessing potential for charging damage in integrated cir...
- Patent number 7,560,345
- Issue date Jul 14, 2009
- International Business Machines Corporation
- Terence B. Hook
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for completely covering a wafer with a passiva...
- Patent number 7,232,695
- Issue date Jun 19, 2007
- International Business Machines Corporation
- Timothy H. Daubenspeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Suppression of localized metal precipitate formation and correspond...
- Patent number 7,173,338
- Issue date Feb 6, 2007
- International Business Machines Corporation
- Jonathan D. Chapple-Sokol
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Halo implant in semiconductor structures
- Patent number 6,949,796
- Issue date Sep 27, 2005
- International Business Machines Corporation
- John J. Ellis-Monaghan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Statistical guardband methodology
- Patent number 6,937,965
- Issue date Aug 30, 2005
- International Business Machines Corporation
- Mark R. Bilak
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit chip carrier assembly
- Patent number 6,503,821
- Issue date Jan 7, 2003
- International Business Machines Corporation
- Donald Seton Farquhar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wire bonding method and apparatus
- Patent number 6,488,198
- Issue date Dec 3, 2002
- International Business Machines Corporation
- Douglas E. Chrzanowski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit chip carrier assembly comprising a stiffener att...
- Patent number 6,329,713
- Issue date Dec 11, 2001
- International Business Machines Corporation
- Donald Seton Farquhar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Robust domino circuit design for high stress conditions
- Patent number 6,097,207
- Issue date Aug 1, 2000
- International Business Machines Corporation
- Kerry Bernstein
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Chip carrier and cable assembly reinforced at edges
- Patent number 5,872,337
- Issue date Feb 16, 1999
- International Business Machines Corporation
- Donald Seton Farquhar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dynamic bus with singular central precharge
- Patent number 5,633,605
- Issue date May 27, 1997
- International Business Machines Corporation
- Jeffrey S. Zimmerman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pass through mode for multi-chip-module die
- Patent number 5,625,631
- Issue date Apr 29, 1997
- International Business Machines Corporation
- Jeffrey S. Zimmerman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
POST-PRODUCTION LAND GRID ARRAY PACKAGE MODIFICATION WITH FIB DEPOS...
- Publication number 20210074595
- Publication date Mar 11, 2021
- BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC
- Jeffrey A. Zimmerman
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD FOR ENHANCED SEMICONDUCTOR PRODUCT DIAGNOSTIC FAIL SIGNATURE...
- Publication number 20170168112
- Publication date Jun 15, 2017
- International Business Machines Corporation
- Robert C. Redburn
- G01 - MEASURING TESTING
Information Patent Application
PROTECTION OF ONE-TIME PROGRAMMABLE (OTP) MEMORY
- Publication number 20140025915
- Publication date Jan 23, 2014
- International Business Machines Corporation
- John A. Fifield
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROLLING DENSITY OF PARTICLES WITHIN UNDERFILL SURROUNDING SOLDE...
- Publication number 20130161822
- Publication date Jun 27, 2013
- International Business Machines Corporation
- Stephane S. Barbeau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTROLLING DENSITY OF PARTICLES WITHIN UNDERFILL SURROUNDING SOLDE...
- Publication number 20120168956
- Publication date Jul 5, 2012
- International Business Machines Corporation
- Stephane S. Barbeau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE, SEMICONDUCTOR STRUCTURE AND METHOD OF MANUFACTURING A SE...
- Publication number 20120104600
- Publication date May 3, 2012
- International Business Machines Corporation
- Timothy H. Daubenspeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUPPRESSION OF LOCALIZED METAL PRECIPITATE FORMATION AND CORRESPOND...
- Publication number 20090294968
- Publication date Dec 3, 2009
- International Business Machines Corporation
- Jonathan D. Chapple-Sokol
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SENSOR, METHOD, AND DESIGN STRUCTURE FOR A LOW-K DELAMINATION SENSOR
- Publication number 20090246892
- Publication date Oct 1, 2009
- John J. Maloney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DESIGN STRUCTURE, SEMICONDUCTOR STRUCTURE AND METHOD OF MANUFACTURI...
- Publication number 20090230547
- Publication date Sep 17, 2009
- Timothy H. Daubenspeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DESIGN STRUCTURE, FAILURE ANALYSIS TOOL AND METHOD OF DETERMINING W...
- Publication number 20090235212
- Publication date Sep 17, 2009
- Timothy H. Daubenspeck
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINING ALLOWABLE ANTENNA AREA AS FUNCTION OF TOTAL GATE INSULA...
- Publication number 20090158230
- Publication date Jun 18, 2009
- International Business Machines Corporation
- Henry A. Bonges, III
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMMUNITY TO CHARGING DAMAGE IN SILICON-ON-INSULATOR DEVICES
- Publication number 20090094567
- Publication date Apr 9, 2009
- Chung-Ping Eng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STRUCTURE AND METHOD FOR REDUCING SUSCEPTIBILITY TO CHARGING DAMAGE...
- Publication number 20070271540
- Publication date Nov 22, 2007
- International Business Machines Corporation
- Chung-Ping Eng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of Assessing Potential for Charging Damage in Integrated Cir...
- Publication number 20070212799
- Publication date Sep 13, 2007
- Terence B. Hook
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUPPRESSION OF LOCALIZED METAL PRECIPITATE FORMATION AND CORRESPOND...
- Publication number 20070040277
- Publication date Feb 22, 2007
- Jonathan D. Chapple-Sokol
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR COMPLETELY COVERING A WAFER WITH A PASSIVA...
- Publication number 20060281197
- Publication date Dec 14, 2006
- International Business Machines Corporation
- Timothy H. Daubenspeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUPPRESSION OF LOCALIZED METAL PRECIPITATE FORMATION AND CORRESPOND...
- Publication number 20050194689
- Publication date Sep 8, 2005
- International Business Machines Corporation
- Jonathan D. Chapple-Sokol
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated circuit chip carrier assembly
- Publication number 20020038913
- Publication date Apr 4, 2002
- Donald S. Farquhar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Wire bonding method and apparatus
- Publication number 20010016462
- Publication date Aug 23, 2001
- International Business Machines Corporation
- Douglas E. Chrzanowski
- H01 - BASIC ELECTRIC ELEMENTS

Jeffrey S. Zimmerman

Person

Patents Grantslast 30 patents

Post-production substrate modification with FIB deposition

Method for enhanced semiconductor product diagnostic fail signature...

Structure, semiconductor structure and method of manufacturing a se...

Protection of one-time programmable (OTP) memory

Structure, semiconductor structure and method of manufacturing a se...

Structure, failure analysis tool and method of determining white bu...

Sensor, method, and design structure for a low-k delamination sensor

Determining allowance antenna area as function of total gate insula...

Suppression of localized metal precipitate formation and correspond...

Suppression of localized metal precipitate formation and correspond...

Method of assessing potential for charging damage in integrated cir...

Method and apparatus for completely covering a wafer with a passiva...

Suppression of localized metal precipitate formation and correspond...

Halo implant in semiconductor structures

Statistical guardband methodology

Integrated circuit chip carrier assembly

Wire bonding method and apparatus

Integrated circuit chip carrier assembly comprising a stiffener att...

Robust domino circuit design for high stress conditions

Chip carrier and cable assembly reinforced at edges

Dynamic bus with singular central precharge

Pass through mode for multi-chip-module die

Patents Applicationslast 30 patents

POST-PRODUCTION LAND GRID ARRAY PACKAGE MODIFICATION WITH FIB DEPOS...

METHOD FOR ENHANCED SEMICONDUCTOR PRODUCT DIAGNOSTIC FAIL SIGNATURE...

PROTECTION OF ONE-TIME PROGRAMMABLE (OTP) MEMORY

CONTROLLING DENSITY OF PARTICLES WITHIN UNDERFILL SURROUNDING SOLDE...

CONTROLLING DENSITY OF PARTICLES WITHIN UNDERFILL SURROUNDING SOLDE...

STRUCTURE, SEMICONDUCTOR STRUCTURE AND METHOD OF MANUFACTURING A SE...

SUPPRESSION OF LOCALIZED METAL PRECIPITATE FORMATION AND CORRESPOND...

SENSOR, METHOD, AND DESIGN STRUCTURE FOR A LOW-K DELAMINATION SENSOR

DESIGN STRUCTURE, SEMICONDUCTOR STRUCTURE AND METHOD OF MANUFACTURI...

DESIGN STRUCTURE, FAILURE ANALYSIS TOOL AND METHOD OF DETERMINING W...

DETERMINING ALLOWABLE ANTENNA AREA AS FUNCTION OF TOTAL GATE INSULA...

IMMUNITY TO CHARGING DAMAGE IN SILICON-ON-INSULATOR DEVICES

STRUCTURE AND METHOD FOR REDUCING SUSCEPTIBILITY TO CHARGING DAMAGE...

Method of Assessing Potential for Charging Damage in Integrated Cir...

SUPPRESSION OF LOCALIZED METAL PRECIPITATE FORMATION AND CORRESPOND...

METHOD AND APPARATUS FOR COMPLETELY COVERING A WAFER WITH A PASSIVA...

SUPPRESSION OF LOCALIZED METAL PRECIPITATE FORMATION AND CORRESPOND...

Integrated circuit chip carrier assembly

Wire bonding method and apparatus