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Jeffrey W. Ritchison
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Plano, TX, US
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Patents Grants
last 30 patents
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Patent Grant
Stress compensation for piezoelectric optical MEMS devices
Patent number
11,148,939
Issue date
Oct 19, 2021
Texas Instruments Incorporated
YungShan Chang
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Stress compensation for piezoelectric optical MEMS devices
Patent number
9,890,040
Issue date
Feb 13, 2018
Texas Instruments Incorporated
YungShan Chang
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Close proximity scanning surface contamination analyzer
Patent number
7,897,410
Issue date
Mar 1, 2011
Texas Instruments Incorporated
Sean M. Collins
G01 - MEASURING TESTING
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Patent Grant
Semiconductor cleaning solution and method
Patent number
6,267,122
Issue date
Jul 31, 2001
Texas Instruments Incorporated
Richard L. Guldi
B08 - CLEANING
Patents Applications
last 30 patents
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Patent Application
STRESS COMPENSATION FOR PIEZOELECTRIC OPTICAL MEMS DEVICES
Publication number
20180179054
Publication date
Jun 28, 2018
TEXAS INSTRUMENTS INCORPORATED
YungShan Chang
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
STRESS COMPENSATION FOR PIEZOELECTRIC OPTICAL MEMS DEVICES
Publication number
20150378127
Publication date
Dec 31, 2015
TEXAS INSTRUMENTS INCORPORATED
YungShan Chang
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Close Proximity Scanning Surface Contamination Analyzer
Publication number
20090153856
Publication date
Jun 18, 2009
TEXAS INSTRUMENTS INCORPORATED
Sean M. Collins
G01 - MEASURING TESTING