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Jeffrey Wayne Eberhard
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Niskayuna, NY, US
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last 30 patents
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Patent Grant
X-ray computed tomography (CT) system for detecting thin objects
Patent number
5,905,806
Issue date
May 18, 1999
L-3 Communications Corporation
Jeffrey Wayne Eberhard
G01 - MEASURING TESTING
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Patent Grant
X-ray computed tomography (CT) system for detecting thin objects
Patent number
5,712,926
Issue date
Jan 27, 1998
Jeffrey Wayne Eberhard
G01 - MEASURING TESTING