Jen-Chieh Lo

Person

New Taipei City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Method for validating measurement data
- Patent number 11,353,324
- Issue date Jun 7, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chui-Jung Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for validating measurement data
- Patent number 10,520,303
- Issue date Dec 31, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chui-Jung Chiu
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for validating measurement data
- Patent number 9,823,066
- Issue date Nov 21, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chui-Jung Chiu
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for validating measurement data
- Patent number 9,404,743
- Issue date Aug 2, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chui-Jung Chiu
- G05 - CONTROLLING REGULATING
Information Patent Grant
Chip level critical point analysis with manufacturer specific data
- Patent number 9,189,587
- Issue date Nov 17, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- I-Chang Shih
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Distinguishable IC patterns with encoded information
- Patent number 8,806,392
- Issue date Aug 12, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shih-Ming Chang
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Patents Applicationslast 30 patents

Information Patent Application
Method for Validating Measurement Data
- Publication number 20200124411
- Publication date Apr 23, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Chui-Jung Chiu
- G05 - CONTROLLING REGULATING
Information Patent Application
Method for Validating Measurement Data
- Publication number 20180066939
- Publication date Mar 8, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chui-Jung Chiu
- G01 - MEASURING TESTING
Information Patent Application
Method for Validating Measurement Data
- Publication number 20160320183
- Publication date Nov 3, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chui-Jeng Chiu
- G01 - MEASURING TESTING
Information Patent Application
Chip Level Critical Point Analysis with Manufacturer Specific Data
- Publication number 20150100927
- Publication date Apr 9, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- I-Chang Shih
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGES MONITORING AND BROADCASTING SYSTEM AND METHOD
- Publication number 20140358992
- Publication date Dec 4, 2014
- HON HAI PRECISION INDUSTRY CO., LTD.
- JEN-HUNG LO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DIGITAL DATA PROCESSING SYSTEM AND METHOD
- Publication number 20140359711
- Publication date Dec 4, 2014
- HON HAI PRECISION INDUSTRY CO., LTD.
- EN-SHIH LIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRONIC DEVICE AND DATA TRACKING METHOD
- Publication number 20140359116
- Publication date Dec 4, 2014
- HON HAI PRECISION INDUSTRY CO., LTD.
- LI-KANG HUNG
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ROLL-CALL PROCESSING SYSTEM AND METHOD
- Publication number 20140350974
- Publication date Nov 27, 2014
- HON HAI PRECISION INDUSTRY CO., LTD.
- JEN-HUNG LO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Image-Based Defect Alignment
- Publication number 20140226893
- Publication date Aug 14, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jen-Chieh Lo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Distinguishable IC Patterns with Encoded Information
- Publication number 20140157212
- Publication date Jun 5, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shih-Ming Chang
- G06 - COMPUTING CALCULATING COUNTING

Jen-Chieh Lo

Person

Patents Grantslast 30 patents

Method for validating measurement data

Method for validating measurement data

Method for validating measurement data

Method for validating measurement data

Chip level critical point analysis with manufacturer specific data

Distinguishable IC patterns with encoded information

Patents Applicationslast 30 patents

Method for Validating Measurement Data

Method for Validating Measurement Data

Method for Validating Measurement Data

Chip Level Critical Point Analysis with Manufacturer Specific Data

IMAGES MONITORING AND BROADCASTING SYSTEM AND METHOD

DIGITAL DATA PROCESSING SYSTEM AND METHOD

ELECTRONIC DEVICE AND DATA TRACKING METHOD

ROLL-CALL PROCESSING SYSTEM AND METHOD

Method and System for Image-Based Defect Alignment

Distinguishable IC Patterns with Encoded Information