Jen-Chou Tseng

Person

Jhudong Township, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Structure and method for enhancing robustness of ESD device
- Patent number 12,002,706
- Issue date Jun 4, 2024
- Taiwan Semiconductor Manufacturing Company Limited
- Alexander Kalnitsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for enhancing robustness of ESD device
- Patent number 11,742,236
- Issue date Aug 29, 2023
- Taiwan Semiconductor Manufacturing Company Limited
- Alexander Kalnitsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming guard ring and circuit device
- Patent number 11,450,735
- Issue date Sep 20, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Wan-Yen Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming electrostatic discharge (ESD) testing structure
- Patent number 11,264,374
- Issue date Mar 1, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Tzu-Heng Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device with a fuse protection circuit
- Patent number 10,991,442
- Issue date Apr 27, 2021
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus of ESD protection in stacked die semiconductor...
- Patent number 10,964,651
- Issue date Mar 30, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jen-Chou Tseng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ESD hard backend structures in nanometer dimension
- Patent number 10,957,687
- Issue date Mar 23, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Jen-Chou Tseng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit device including guard ring and method of forming guard ring
- Patent number 10,868,112
- Issue date Dec 15, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd
- Wan-Yen Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for enhancing robustness of ESD device
- Patent number 10,854,501
- Issue date Dec 1, 2020
- Taiwan Semiconductor Manufacturing Company Limited
- Alexander Kalnitsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device with a fuse protection circuit
- Patent number 10,803,967
- Issue date Oct 13, 2020
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of forming electrostatic discharge (ESD) testing structure
- Patent number 10,756,082
- Issue date Aug 25, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd
- Tzu-Heng Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device with a fuse protection circuit
- Patent number 10,643,726
- Issue date May 5, 2020
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- G11 - INFORMATION STORAGE
Information Patent Grant
ESD hard backend structures in nanometer dimension
- Patent number 10,629,588
- Issue date Apr 21, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jen-Chou Tseng
- G01 - MEASURING TESTING
Information Patent Grant
FinFET-based ESD devices and methods for forming the same
- Patent number 10,546,850
- Issue date Jan 28, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wun-Jie Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ESD testing structure, method of using same and method of forming same
- Patent number 10,325,906
- Issue date Jun 18, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd
- Tzu-Heng Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device with a fuse protection circuit
- Patent number 10,283,210
- Issue date May 7, 2019
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Voltage detector circuits and methods
- Patent number 10,284,190
- Issue date May 7, 2019
- TAIWAN SEMICONDUTOR MANUFACTURING COMPANY, LTD.
- Ming-Fu Tsai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Rotated STI diode on FinFET technology
- Patent number 10,269,986
- Issue date Apr 23, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sun-Jay Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ESD hard backend structures in nanometer dimension
- Patent number 10,170,461
- Issue date Jan 1, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jen-Chou Tseng
- G01 - MEASURING TESTING
Information Patent Grant
FinFET-based ESD devices and methods for forming the same
- Patent number 10,163,894
- Issue date Dec 25, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wun-Jie Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus of ESD protection in stacked die semiconductor...
- Patent number 10,163,823
- Issue date Dec 25, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jen-Chou Tseng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ESD protection system utilizing gate-floating scheme and control ci...
- Patent number 10,158,225
- Issue date Dec 18, 2018
- Taiwan Semiconductor Manufacturing Company Limited
- Jen-Chou Tseng
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Method of forming guard ring structure
- Patent number 10,128,329
- Issue date Nov 13, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd
- Wan-Yen Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device with a fuse protection circuit
- Patent number 10,109,366
- Issue date Oct 23, 2018
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- G11 - INFORMATION STORAGE
Information Patent Grant
Fin ESD protection diode and fabrication method thereof
- Patent number 10,096,589
- Issue date Oct 9, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wun-Jie Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultra high voltage device
- Patent number 10,074,745
- Issue date Sep 11, 2018
- Taiwan Semiconductor Manufacturing Company Limited
- Ming-Fu Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FinFET-based ESD devices and methods for forming the same
- Patent number 10,026,727
- Issue date Jul 17, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wun-Jie Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for enhancing robustness of ESD device
- Patent number 10,026,640
- Issue date Jul 17, 2018
- Taiwan Semiconductor Manufacturing Company Limited
- Alexander Kalnitsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic discharge protection for three dimensional integrated...
- Patent number 9,979,186
- Issue date May 22, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tzu-Heng Chang
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Electrostatic discharge protection circuit and method for radio fre...
- Patent number 9,917,079
- Issue date Mar 13, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ming Hsien Tsai
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
Structure and Method for Enhancing Robustness of ESD Device
- Publication number 20230352338
- Publication date Nov 2, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Alexander Kalnitsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GUARD RING AND CIRCUIT DEVICE
- Publication number 20220359648
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wan-Yen LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING GUARD RING AND CIRCUIT DEVICE
- Publication number 20210091176
- Publication date Mar 25, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wan-Yen LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Structure and Method for Enhancing Robustness of ESD Device
- Publication number 20210082743
- Publication date Mar 18, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Alexander Kalnitsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Memory Device with a Fuse Protection Circuit
- Publication number 20200402599
- Publication date Dec 24, 2020
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD OF FORMING ELECTROSTATIC DISCHARGE (ESD) TESTING STRUCTURE
- Publication number 20200381419
- Publication date Dec 3, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tzu-Heng CHANG
- G01 - MEASURING TESTING
Information Patent Application
Memory Device with a Fuse Protection Circuit
- Publication number 20200227126
- Publication date Jul 16, 2020
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- G11 - INFORMATION STORAGE
Information Patent Application
ESD HARD BACKEND STRUCTURES IN NANOMETER DIMENSION
- Publication number 20200219868
- Publication date Jul 9, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Jen-Chou Tseng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING ELECTROSTATIC DISCHARGE (ESD) TESTING STRUCTURE
- Publication number 20190304967
- Publication date Oct 3, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tzu-Heng CHANG
- G01 - MEASURING TESTING
Information Patent Application
Memory Device with a Fuse Protection Circuit
- Publication number 20190252032
- Publication date Aug 15, 2019
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- G11 - INFORMATION STORAGE
Information Patent Application
FinFET-Based ESD Devices and Methods for Forming the Same
- Publication number 20190148357
- Publication date May 16, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wun-Jie Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus of ESD Protection in Stacked Die Semiconductor...
- Publication number 20190123001
- Publication date Apr 25, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jen-Chou Tseng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD HARD BACKEND STRUCTURES IN NANOMETER DIMENSION
- Publication number 20190109129
- Publication date Apr 11, 2019
- Taiwan Semiconductor Manufacturing Co., LTD
- Jen-Chou Tseng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CIRCUIT DEVICE INCLUDING GUARD RING AND METHOD OF FORMING GUARD RING
- Publication number 20190096990
- Publication date Mar 28, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wan-Yen LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Memory Device with a Fuse Protection Circuit
- Publication number 20190019565
- Publication date Jan 17, 2019
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- G11 - INFORMATION STORAGE
Information Patent Application
Structure and Method for Enhancing Robustness of ESD Device
- Publication number 20180315641
- Publication date Nov 1, 2018
- Taiwan Semiconductor Manufacturing Company Limited
- ALEXANDER KALNITSKY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FinFET-Based ESD Devices and Methods for Forming the Same
- Publication number 20180166437
- Publication date Jun 14, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wun-Jie Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Memory Device with a Fuse Protection Circuit
- Publication number 20180166143
- Publication date Jun 14, 2018
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD TESTING STRUCTURE, METHOD OF USING SAME AND METHOD OF FORMING SAME
- Publication number 20180088163
- Publication date Mar 29, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tzu-Heng CHANG
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE DETECTOR CIRCUITS AND METHODS
- Publication number 20170346479
- Publication date Nov 30, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ming-Fu TSAI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Ultra High Voltage Device
- Publication number 20170256643
- Publication date Sep 7, 2017
- Taiwan Semiconductor Manufacturing Company Limited
- MING-FU TSAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FinFET-Based ESD Devices and Methods for Forming the Same
- Publication number 20170141098
- Publication date May 18, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wun-Jie Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD HARD BACKEND STRUCTURES IN NANOMETER DIMENSION
- Publication number 20170141100
- Publication date May 18, 2017
- Taiwan Semiconductor Manufacturing Co., LTD
- Jen-Chou Tseng
- G01 - MEASURING TESTING
Information Patent Application
ESD Protection System Utilizing Gate-Floating Scheme and Control Ci...
- Publication number 20170098935
- Publication date Apr 6, 2017
- Taiwan Semiconductor Manufacturing Company Limited
- JEN-CHOU TSENG
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Ultra High Voltage Device
- Publication number 20170005194
- Publication date Jan 5, 2017
- Taiwan Semiconductor Manufacturing Company Limited
- MING-FU TSAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING GUARD RING STRUCTURE
- Publication number 20160359000
- Publication date Dec 8, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wan-Yen LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FinFET-Based ESD Devices and Methods for Forming the Same
- Publication number 20160329319
- Publication date Nov 10, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wun-Jie Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ULTRA HIGH VOLTAGE DEVICE
- Publication number 20160240668
- Publication date Aug 18, 2016
- Taiwan Semiconductor Manufacturing Company Limited
- MING-FU TSAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD PROTECTION SYSTEM UTILIZING GATE-FLOATING SCHEME AND CONTROL CI...
- Publication number 20160241020
- Publication date Aug 18, 2016
- Taiwan Semiconductor Manufacturing Company Limited
- JEN-CHOU TSENG
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Method and Apparatus of ESD Protection in Stacked Die Semiconductor...
- Publication number 20160225727
- Publication date Aug 4, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jen-Chou Tseng
- H01 - BASIC ELECTRIC ELEMENTS

Jen-Chou Tseng

Person

Patents Grantslast 30 patents

Structure and method for enhancing robustness of ESD device

Structure and method for enhancing robustness of ESD device

Method of forming guard ring and circuit device

Method of forming electrostatic discharge (ESD) testing structure

Memory device with a fuse protection circuit

Method and apparatus of ESD protection in stacked die semiconductor...

ESD hard backend structures in nanometer dimension

Circuit device including guard ring and method of forming guard ring

Structure and method for enhancing robustness of ESD device

Memory device with a fuse protection circuit

Method of forming electrostatic discharge (ESD) testing structure

Memory device with a fuse protection circuit

ESD hard backend structures in nanometer dimension

FinFET-based ESD devices and methods for forming the same

ESD testing structure, method of using same and method of forming same

Memory device with a fuse protection circuit

Voltage detector circuits and methods

Rotated STI diode on FinFET technology

ESD hard backend structures in nanometer dimension

FinFET-based ESD devices and methods for forming the same

Method and apparatus of ESD protection in stacked die semiconductor...

ESD protection system utilizing gate-floating scheme and control ci...

Method of forming guard ring structure

Memory device with a fuse protection circuit

Fin ESD protection diode and fabrication method thereof

Ultra high voltage device

FinFET-based ESD devices and methods for forming the same

Structure and method for enhancing robustness of ESD device

Electrostatic discharge protection for three dimensional integrated...

Electrostatic discharge protection circuit and method for radio fre...

Patents Applicationslast 30 patents

Structure and Method for Enhancing Robustness of ESD Device

GUARD RING AND CIRCUIT DEVICE

METHOD OF FORMING GUARD RING AND CIRCUIT DEVICE

Structure and Method for Enhancing Robustness of ESD Device

Memory Device with a Fuse Protection Circuit

METHOD OF FORMING ELECTROSTATIC DISCHARGE (ESD) TESTING STRUCTURE

Memory Device with a Fuse Protection Circuit

ESD HARD BACKEND STRUCTURES IN NANOMETER DIMENSION

METHOD OF FORMING ELECTROSTATIC DISCHARGE (ESD) TESTING STRUCTURE

Memory Device with a Fuse Protection Circuit

FinFET-Based ESD Devices and Methods for Forming the Same

Method and Apparatus of ESD Protection in Stacked Die Semiconductor...

ESD HARD BACKEND STRUCTURES IN NANOMETER DIMENSION

CIRCUIT DEVICE INCLUDING GUARD RING AND METHOD OF FORMING GUARD RING

Memory Device with a Fuse Protection Circuit

Structure and Method for Enhancing Robustness of ESD Device

FinFET-Based ESD Devices and Methods for Forming the Same

Memory Device with a Fuse Protection Circuit

ESD TESTING STRUCTURE, METHOD OF USING SAME AND METHOD OF FORMING SAME

VOLTAGE DETECTOR CIRCUITS AND METHODS

Ultra High Voltage Device

FinFET-Based ESD Devices and Methods for Forming the Same

ESD HARD BACKEND STRUCTURES IN NANOMETER DIMENSION

ESD Protection System Utilizing Gate-Floating Scheme and Control Ci...

Ultra High Voltage Device

METHOD OF FORMING GUARD RING STRUCTURE

FinFET-Based ESD Devices and Methods for Forming the Same

ULTRA HIGH VOLTAGE DEVICE

ESD PROTECTION SYSTEM UTILIZING GATE-FLOATING SCHEME AND CONTROL CI...

Method and Apparatus of ESD Protection in Stacked Die Semiconductor...