Jeng-Hang Lee

Follow

Person

King-Ching Town, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Micro probing tip made by micro machine method
- Patent number 6,797,528
- Issue date Sep 28, 2004
- Taiwan Semiconductor Manufacturing Co., Ltd
- Mingo Liu
- G01 - MEASURING TESTING
Information Patent Grant
SRAM layout for relaxing mechanical stress in shallow trench isolat...
- Patent number 6,635,936
- Issue date Oct 21, 2003
- Taiwan Semiconductor Manufacturing Company
- Shou-Gwo Wuu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Primary ion or electron current adjustment to enhance voltage contr...
- Patent number 6,573,736
- Issue date Jun 3, 2003
- Taiwan Semiconductor Manufacturing Company
- Jeng-Han Lee
- G01 - MEASURING TESTING
Information Patent Grant
SRAM layout for relaxing mechanical stress in shallow trench isolat...
- Patent number 6,117,722
- Issue date Sep 12, 2000
- Taiwan Semiconductor Manufacturing Company
- Shou-Gwo Wuu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Top view TEM sample preparation method
- Patent number 5,935,870
- Issue date Aug 10, 1999
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jeng-Hang Lee
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Micro probing tip made by micro machine method
- Publication number 20030134441
- Publication date Jul 17, 2003
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Mingo Liu
- G01 - MEASURING TESTING