Jeng-Huei Yang

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Taichung City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Formation of prescribed pattern on wafer for use in SEM defect offset
- Patent number 8,208,714
- Issue date Jun 26, 2012
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Mu-Chieh Liu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FORMATION OF PRESCRIBED PATTERN ON WAFER FOR USE IN SEM DEFECT OFFSET
- Publication number 20100296722
- Publication date Nov 25, 2010
- Taiwan Semiconductor Manufacturing Co., LTD
- Mu-Chieh LIU
- G01 - MEASURING TESTING