Jeng-Jyi Hwang

Person

Chu-Tong Township, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Multi-point chemical mechanical polishing end point detection syste...
- Patent number 10,090,207
- Issue date Oct 2, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jiann Lih Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
pH-adjuster free chemical mechanical planarization slurry
- Patent number 10,035,929
- Issue date Jul 31, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shu-Hao Huang
- B24 - GRINDING POLISHING
Information Patent Grant
Method of identifying airborne molecular contamination source
- Patent number 9,958,424
- Issue date May 1, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tzu-Sou Chuang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method of cleaning wafers
- Patent number 9,691,641
- Issue date Jun 27, 2017
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chia-Hung Huang
- B08 - CLEANING

Patents Applicationslast 30 patents

Information Patent Application
pH-ADJUSTER FREE CHEMICAL MECHANICAL PLANARIZATION SLURRY
- Publication number 20170152402
- Publication date Jun 1, 2017
- Taiwan Semiconductor Manufacturing Co., LTD
- Shu-Hao Huang
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
WAFER PARTICLE REMOVAL
- Publication number 20150107619
- Publication date Apr 23, 2015
- Taiwan Semiconductor Manufacturing Company Limited
- Jiann Lih Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR CLEANING A BRUSH SURFACE HAVING A CONTAMINATION
- Publication number 20140196744
- Publication date Jul 17, 2014
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Jiann-Lih WU
- A46 - BRUSHWARE
Information Patent Application
APPARATUS AND METHOD OF CLEANING WAFERS
- Publication number 20140166055
- Publication date Jun 19, 2014
- Taiwan Semiconductor Manufacturing Co., LTD
- Chia-Hung HUANG
- C11 - ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES FATTY ACIDS...
Information Patent Application
MULTI-POINT CHEMICAL MECHANICAL POLISHING END POINT DETECTION SYSTE...
- Publication number 20140148008
- Publication date May 29, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jiann Lih WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method Of Identifying Airborne Molecular Contamination Source
- Publication number 20140095083
- Publication date Apr 3, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tzu-Sou Chuang
- G01 - MEASURING TESTING

Jeng-Jyi Hwang

Person

Patents Grantslast 30 patents

Multi-point chemical mechanical polishing end point detection syste...

pH-adjuster free chemical mechanical planarization slurry

Method of identifying airborne molecular contamination source

Apparatus and method of cleaning wafers

Patents Applicationslast 30 patents

pH-ADJUSTER FREE CHEMICAL MECHANICAL PLANARIZATION SLURRY

WAFER PARTICLE REMOVAL

METHOD AND DEVICE FOR CLEANING A BRUSH SURFACE HAVING A CONTAMINATION

APPARATUS AND METHOD OF CLEANING WAFERS

MULTI-POINT CHEMICAL MECHANICAL POLISHING END POINT DETECTION SYSTE...

Method Of Identifying Airborne Molecular Contamination Source