Jenn-Kuen Leong

Person

Cupertino, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Continuous degenerate elliptical retarder for sensitive particle de...
- Patent number 11,879,853
- Issue date Jan 23, 2024
- KLA Corporation
- Xuefeng Liu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus and method for rotating an optical objective
- Patent number 11,733,172
- Issue date Aug 22, 2023
- KLA Corporation
- Anatoly Romanovsky
- G01 - MEASURING TESTING
Information Patent Grant
Sensitive particle detection with spatially-varying polarization ro...
- Patent number 11,243,175
- Issue date Feb 8, 2022
- KLA Corporation
- Xuefeng Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensitive particle detection with spatially-varying polarization ro...
- Patent number 10,948,423
- Issue date Mar 16, 2021
- KLA Corporation
- Xuefeng Liu
- G01 - MEASURING TESTING
Information Patent Grant
Radial polarizer for particle detection
- Patent number 10,942,135
- Issue date Mar 9, 2021
- KLA Corporation
- Jenn-Kuen Leong
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection
- Patent number 9,291,575
- Issue date Mar 22, 2016
- KLA-Tencor Corp.
- Guoheng Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection
- Patent number 8,891,079
- Issue date Nov 18, 2014
- KLA-Tencor Corp.
- Guoheng Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection system using laser line illumination with two di...
- Patent number 7,525,649
- Issue date Apr 28, 2009
- KLA-Tencor Technologies Corporation
- Jenn-Kuen Leong
- G01 - MEASURING TESTING
Information Patent Grant
Method and system using exposure control to inspect a surface
- Patent number 6,724,473
- Issue date Apr 20, 2004
- KLA-Tencor Technologies Corporation
- Jenn-Kuen Leong
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONTINUOUS DEGENERATE ELLIPTICAL RETARDER FOR SENSITIVE PARTICLE DE...
- Publication number 20220268710
- Publication date Aug 25, 2022
- Xuefeng Liu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
APPARATUS AND METHOD FOR ROTATING AN OPTICAL OBJECTIVE
- Publication number 20210356406
- Publication date Nov 18, 2021
- Anatoly Romanovsky
- G01 - MEASURING TESTING
Information Patent Application
SENSITIVE PARTICLE DETECTION WITH SPATIALLY-VARYING POLARIZATION RO...
- Publication number 20210164918
- Publication date Jun 3, 2021
- KLA Corporation
- Xuefeng Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sensitive Particle Detection with Spatially-Varying Polarization Ro...
- Publication number 20200264109
- Publication date Aug 20, 2020
- KLA Corporation
- Xuefeng Liu
- G01 - MEASURING TESTING
Information Patent Application
Radial Polarizer for Particle Detection
- Publication number 20200150054
- Publication date May 14, 2020
- KLA Corporation
- Jenn-Kuen Leong
- G01 - MEASURING TESTING
Information Patent Application
Wafer Inspection
- Publication number 20150103348
- Publication date Apr 16, 2015
- KLA-Tencor Corporation
- Guoheng Zhao
- G01 - MEASURING TESTING
Information Patent Application
Wafer Inspection
- Publication number 20140009759
- Publication date Jan 9, 2014
- KLA-Tencor Corporation
- Guoheng Zhao
- G01 - MEASURING TESTING
Information Patent Application
Method and system using exposure control to inspect a surface
- Publication number 20030223058
- Publication date Dec 4, 2003
- Jenn-Kuen Leong
- G01 - MEASURING TESTING

Jenn-Kuen Leong

Person

Patents Grantslast 30 patents

Continuous degenerate elliptical retarder for sensitive particle de...

Apparatus and method for rotating an optical objective

Sensitive particle detection with spatially-varying polarization ro...

Sensitive particle detection with spatially-varying polarization ro...

Radial polarizer for particle detection

Wafer inspection

Wafer inspection

Surface inspection system using laser line illumination with two di...

Method and system using exposure control to inspect a surface

Patents Applicationslast 30 patents

CONTINUOUS DEGENERATE ELLIPTICAL RETARDER FOR SENSITIVE PARTICLE DE...

APPARATUS AND METHOD FOR ROTATING AN OPTICAL OBJECTIVE

SENSITIVE PARTICLE DETECTION WITH SPATIALLY-VARYING POLARIZATION RO...

Sensitive Particle Detection with Spatially-Varying Polarization Ro...

Radial Polarizer for Particle Detection

Wafer Inspection

Wafer Inspection

Method and system using exposure control to inspect a surface