Jennifer J. Huening

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Hillsboro, OR, US

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Patents Applicationslast 30 patents

Information Patent Application
ENHANCED ELECTRON BEAM (E-BEAM) APPARATUS AND METHODOLOGY WITH NANO...
- Publication number 20240219460
- Publication date Jul 4, 2024
- Xianghong TONG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR A VACUUM COMPATIBLE ELECTRICAL INTERFACE, ENA...
- Publication number 20240219452
- Publication date Jul 4, 2024
- Intel Corporation
- Prasoon JOSHI
- G01 - MEASURING TESTING
Information Patent Application
STROBOSCOPIC ELECTRON-BEAM SIGNAL IMAGE MAPPING
- Publication number 20230317408
- Publication date Oct 5, 2023
- Intel Corporation
- Xianghong Tong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER LEVEL ELECTRON BEAM PROBER
- Publication number 20230305057
- Publication date Sep 28, 2023
- Intel Corporation
- Xianghong Tong
- G01 - MEASURING TESTING