Membership
Tour
Register
Log in
Jennifer W. Cruz
Follow
Person
Walnut, CA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Applications
last 30 patents
Information
Patent Application
SYSTEMS AND METHODS FOR ADVANCED RAPID IMAGING AND ANALYSIS FOR EAR...
Publication number
20160047940
Publication date
Feb 18, 2016
California Institute of Technology
Susan Ethel Owen
G01 - MEASURING TESTING