Jennming Chen

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Campbell, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for preparing a sample for thin film analysis
- Patent number 7,190,441
- Issue date Mar 13, 2007
- KLA-Tencor Technologies Corp.
- James T. McWhirter
- G01 - MEASURING TESTING
Information Patent Grant
Film measurement system with improved calibration
- Patent number 5,771,094
- Issue date Jun 23, 1998
- KLA-Tencor Corporation
- Joseph Carter
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for calibrating an ellipsometer
- Patent number 5,581,350
- Issue date Dec 3, 1996
- Tencor Instruments
- Xing Chen
- G01 - MEASURING TESTING