Jens Konstantin Rehanek

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Berlin, DE

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Patents Applicationslast 30 patents

Information Patent Application
DEVICE FOR MEASURING RESONANT INELASTIC X-RAY SCATTERING OF A SAMPLE
- Publication number 20150185168
- Publication date Jul 2, 2015
- HELMHOLTZ-ZENTRUM BERLIN FUER MATERIALIEN UND ENERGIE GMBH
- Alexei Erko
- G01 - MEASURING TESTING