Jens Luepke

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Ottobrunn, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method and device for testing semiconductor memory devices
- Patent number 7,277,338
- Issue date Oct 2, 2007
- Infineon Technologies AG
- Eric Cordes
- G11 - INFORMATION STORAGE
Information Patent Grant
Address generator for generating addresses for testing a circuit
- Patent number 6,957,373
- Issue date Oct 18, 2005
- Infineon Technologies AG
- Wolfgang Ernst
- G11 - INFORMATION STORAGE
Information Patent Grant
Test data generator
- Patent number 6,865,707
- Issue date Mar 8, 2005
- Infineon Technologies AG
- Wolfgang Ernst
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit
- Patent number 6,744,272
- Issue date Jun 1, 2004
- Wolfgang Ernst
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit for testing a circuit
- Patent number 6,618,305
- Issue date Sep 9, 2003
- Infineon Technologies AG
- Wolfgang Ernst
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Method and device for testing semiconductor memory devices
- Publication number 20050057988
- Publication date Mar 17, 2005
- Eric Cordes
- G11 - INFORMATION STORAGE
Information Patent Application
Test circuit for testing a synchronous circuit
- Publication number 20030005389
- Publication date Jan 2, 2003
- Wolfgang Ernst
- G01 - MEASURING TESTING
Information Patent Application
Test circuit for testing a circuit
- Publication number 20020196688
- Publication date Dec 26, 2002
- Infineon Technologies AG
- Wolfgang Ernst
- G01 - MEASURING TESTING
Information Patent Application
Test circuit
- Publication number 20020171447
- Publication date Nov 21, 2002
- Wolfgang Ernst
- G11 - INFORMATION STORAGE
Information Patent Application
Address generator for generating addresses for testing a circuit
- Publication number 20020170012
- Publication date Nov 14, 2002
- Wolfgang Ernst
- G11 - INFORMATION STORAGE
Information Patent Application
Test data generator
- Publication number 20020157052
- Publication date Oct 24, 2002
- Infineon Technologies AG
- Wolfgang Ernst
- G01 - MEASURING TESTING