Jens Möckel

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Muchen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for processing wafers
- Patent number 7,064,809
- Issue date Jun 20, 2006
- Infineon Technologies AG
- Franz Kemper
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for testing a plurality of devices disposed on a wafer and c...
- Patent number 6,917,214
- Issue date Jul 12, 2005
- Infineon Technologies AG
- Gerrit Farber
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit having electrical connecting elements
- Patent number 6,803,612
- Issue date Oct 12, 2004
- Infineon Technologies AG
- Matthias Uwe Lehr
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for releasable contact-connection of a plurality of integrat...
- Patent number 6,773,934
- Issue date Aug 10, 2004
- Infineon Technologies AG
- Jens Möckel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and method for processing wafers
- Publication number 20050168715
- Publication date Aug 4, 2005
- Franz Kemper
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated circuit having electrical connecting elements
- Publication number 20040057301
- Publication date Mar 25, 2004
- Matthias Uwe Lehr
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for testing a plurality of devices
- Publication number 20030076127
- Publication date Apr 24, 2003
- Gerrit Farber
- G11 - INFORMATION STORAGE
Information Patent Application
Method for releasable contact-connection of a plurality of integrat...
- Publication number 20020137238
- Publication date Sep 26, 2002
- Jens Mockel
- G01 - MEASURING TESTING