Jens Mondry

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Jena, DE

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Patents Grantslast 30 patents

Information Patent Grant
Measuring arrangement for reflection measurement
- Patent number 10,054,484
- Issue date Aug 21, 2018
- CARL ZEISS SPECTROSCOPY GMBH
- Jörg Margraf
- G01 - MEASURING TESTING
Information Patent Grant
Process and apparatus for spectral reflectance and transmission mea...
- Patent number 5,764,352
- Issue date Jun 9, 1998
- Balzers Und Leybold Deutschland Holding AG
- Peter Kappel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASURING ARRANGEMENT FOR REFLECTION MEASUREMENT
- Publication number 20170211975
- Publication date Jul 27, 2017
- Jörg MARGRAF
- G01 - MEASURING TESTING