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Jens P. Dybwad
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Acton, MA, US
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last 30 patents
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Patent Grant
Conjugate interferometer
Patent number
4,787,745
Issue date
Nov 29, 1988
The Perkin-Elmer Corporation
Jens P. Dybwad
G01 - MEASURING TESTING
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Patent Grant
Refractively scanned interferometer
Patent number
4,654,530
Issue date
Mar 31, 1987
Jens P. Dybwad
G01 - MEASURING TESTING