Jens Stolze

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Dresden, DE

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Patents Grantslast 30 patents

Information Patent Grant
Etching processing method for a material layer
- Patent number 6,852,639
- Issue date Feb 8, 2005
- Infineon Technologies AG
- Matthias Rudolph
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detecting a process endpoint from a change in reflectivity
- Patent number 6,449,038
- Issue date Sep 10, 2002
- Applied Materials, Inc.
- Jens Stolze
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Processing method
- Publication number 20040023507
- Publication date Feb 5, 2004
- Matthias Rudolph
- H01 - BASIC ELECTRIC ELEMENTS