Jens ULLMANN

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Pulsed current source with internal impedance matching
- Patent number 9,772,351
- Issue date Sep 26, 2017
- Qualitau, Inc.
- Jens Ullmann
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Electromigration tester for high capacity and high current
- Patent number 7,602,205
- Issue date Oct 13, 2009
- Qualitau, Inc.
- Jens Ullmann
- G01 - MEASURING TESTING
Information Patent Grant
High temperature ceramic socket configured to test packaged semicon...
- Patent number 7,602,201
- Issue date Oct 13, 2009
- Qualitau, Inc.
- Jose Ysaguirre
- G01 - MEASURING TESTING
Information Patent Grant
High temperature ceramic die package and DUT board socket
- Patent number 7,598,760
- Issue date Oct 6, 2009
- Qualitau, Inc.
- Thomas G. Bensing
- G01 - MEASURING TESTING
Information Patent Grant
Voltage source measurement unit with minimized common mode errors
- Patent number 7,429,856
- Issue date Sep 30, 2008
- Qualitau, Inc.
- Jens Ullmann
- G01 - MEASURING TESTING
Information Patent Grant
High temperature open ended zero insertion force (ZIF) test socket
- Patent number 7,172,450
- Issue date Feb 6, 2007
- QualiTau, Inc.
- Robert James Sylvia
- G01 - MEASURING TESTING
Information Patent Grant
Pulsed current generator circuit with charge booster
- Patent number 7,049,713
- Issue date May 23, 2006
- QualiTau, Inc.
- Peter Cuevas
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PULSED CURRENT SOURCE WITH INTERNAL IMPEDANCE MATCHING
- Publication number 20170131327
- Publication date May 11, 2017
- QUALITAU, INC.
- Jens ULLMANN
- G01 - MEASURING TESTING
Information Patent Application
PULSED CURRENT SOURCE WITH INTERNAL IMPEDANCE MATCHING
- Publication number 20170131326
- Publication date May 11, 2017
- QUALITAU, INC.
- Jens Ullmann
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMIGRATION TESTER FOR HIGH CAPACITY AND HIGH CURRENT
- Publication number 20090206869
- Publication date Aug 20, 2009
- QUALITAU, INC.
- Jens Ullmann
- G01 - MEASURING TESTING
Information Patent Application
HIGH TEMPERATURE CERAMIC SOCKET CONFIGURED TO TEST PACKAGED SEMICON...
- Publication number 20080315900
- Publication date Dec 25, 2008
- QUALITAU, INC.
- Jose Ysaguirre
- G01 - MEASURING TESTING
Information Patent Application
Pulsed current generator circuit with charge booster
- Publication number 20050128655
- Publication date Jun 16, 2005
- QualiTau, Inc.
- Peter Cuevas
- G01 - MEASURING TESTING