Jeong Ho BANG

Person

Seoul, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Display device
- Patent number 12,165,592
- Issue date Dec 10, 2024
- Samsung Display Co., Ltd.
- Jeong Hun Bang
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Containerized HVAC control
- Patent number 12,004,327
- Issue date Jun 4, 2024
- SolarEdge Technologies Korea Limited Company
- Ho-June Yu
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Cleaning solution production systems and methods, and plasma reacti...
- Patent number 11,664,242
- Issue date May 30, 2023
- Samsung Electronics Co., Ltd.
- Beom Jin Yoo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Display apparatus and controlling method thereof
- Patent number 11,189,184
- Issue date Nov 30, 2021
- Samsung Electronics Co., Ltd.
- Dai-boong Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cleaning solution production systems and methods, and plasma reacti...
- Patent number 11,107,705
- Issue date Aug 31, 2021
- Samsung Electronics Co., Ltd.
- Beom Jin Yoo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Display device
- Patent number 10,825,394
- Issue date Nov 3, 2020
- Samsung Display Co., Ltd.
- Mi Hae Kim
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Input sensing unit and display device including the same
- Patent number 10,444,904
- Issue date Oct 15, 2019
- Samsung Display Co., Ltd.
- Jeong Yun Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Display apparatus
- Patent number 9,426,890
- Issue date Aug 23, 2016
- Samsung Electronics Co., Ltd.
- Hyo Jae Jang
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Handoff system and method between different kinds of devices, SIP s...
- Patent number 8,018,899
- Issue date Sep 13, 2011
- Samsung Electronics Co., Ltd.
- Se-jong Oh
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test apparatus having multiple head boards at one handler and its t...
- Patent number 7,602,172
- Issue date Oct 13, 2009
- Samsung Electronics Co., Ltd.
- Ae-Yong Chung
- G01 - MEASURING TESTING
Information Patent Grant
Fuse regions of a semiconductor memory device and methods of fabric...
- Patent number 7,492,032
- Issue date Feb 17, 2009
- Samsung Electronics Co., Ltd.
- Kwang-Kyu Bang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Connector for testing a semiconductor package
- Patent number 7,438,563
- Issue date Oct 21, 2008
- Samsung Electronics Co., Ltd.
- Young-Bae Chung
- G01 - MEASURING TESTING
Information Patent Grant
Test system of semiconductor device having a handler remote control...
- Patent number 7,408,339
- Issue date Aug 5, 2008
- Samsung Electronics Co., Ltd.
- Ae-Yong Chung
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus having multiple test sites at one handler and its te...
- Patent number 7,378,864
- Issue date May 27, 2008
- Samsung Electronics Co., Ltd.
- Ae-Yong Chung
- G01 - MEASURING TESTING
Information Patent Grant
Multichip package test
- Patent number 7,327,154
- Issue date Feb 5, 2008
- Samsung Electronics Co., Ltd.
- Young-Gu Shin
- G01 - MEASURING TESTING
Information Patent Grant
Flash memory test system and method capable of test time reduction
- Patent number 7,254,757
- Issue date Aug 7, 2007
- Samsung Electronics Co., Ltd.
- Dong-Kyoo Park
- G11 - INFORMATION STORAGE
Information Patent Grant
Test system of semiconductor device having a handler remote control...
- Patent number 7,230,417
- Issue date Jun 12, 2007
- Samsung Electronics Co., Ltd.
- Ae-Yong Chung
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for performing parallel test on integrated cir...
- Patent number 7,227,351
- Issue date Jun 5, 2007
- Samsung Electronics Co., Ltd.
- Woo-Il Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Burn-in test apparatus for BGA packages using forced heat exhaust
- Patent number 7,084,655
- Issue date Aug 1, 2006
- Samsung Electronics Co., Ltd.
- Byung-Jun Min
- G01 - MEASURING TESTING
Information Patent Grant
Test kit for semiconductor package and method for testing semicondu...
- Patent number 7,017,428
- Issue date Mar 28, 2006
- Samsung Electronics Co., Ltd.
- Byoung-jun Min
- G01 - MEASURING TESTING
Information Patent Grant
Method for electrical testing of semiconductor package that detects...
- Patent number 6,960,908
- Issue date Nov 1, 2005
- Samsung Electronics Co., Ltd.
- Ae-yong Chung
- G11 - INFORMATION STORAGE
Information Patent Grant
Multichip package test
- Patent number 6,943,577
- Issue date Sep 13, 2005
- Samsung Electronics Co., Ltd.
- Young-Gu Shin
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a remnant batch of semiconductor devices
- Patent number 6,922,050
- Issue date Jul 26, 2005
- Samsung Electronics Co., Ltd.
- Ae-yong Chung
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus having multiple test sites at one handler and its te...
- Patent number 6,903,567
- Issue date Jun 7, 2005
- Samsung Electronics Co., Ltd.
- Ae-Yong Chung
- G01 - MEASURING TESTING
Information Patent Grant
Laser link structure capable of preventing an upper crack and broad...
- Patent number 6,861,682
- Issue date Mar 1, 2005
- Samsung Electronics Co., Ltd.
- Jeong-ho Bang
- G11 - INFORMATION STORAGE
Information Patent Grant
Fuse box including make-link and redundant address decoder having t...
- Patent number 6,850,450
- Issue date Feb 1, 2005
- Samsung Electronics Co., Ltd.
- Kwang-kyu Bang
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of electrically testing semiconductor devices
- Patent number 6,842,031
- Issue date Jan 11, 2005
- Samsung Electronics Co., Ltd.
- Gil-Young Koh
- G01 - MEASURING TESTING
Information Patent Grant
Wafer treatment method for protecting fuse box of semiconductor chip
- Patent number 6,841,425
- Issue date Jan 11, 2005
- Samsung Electronics Co., Ltd.
- Jae-Il Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma display panel apparatus and method of protecting an over cur...
- Patent number 6,710,550
- Issue date Mar 23, 2004
- Samsung Electronics Co., Ltd.
- Jeong-ho Bang
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Apparatus for generating dynamic focus signal
- Patent number 6,700,337
- Issue date Mar 2, 2004
- Samsung Electronics Co., Ltd.
- Jeong-Ho Bang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
Containerized HVAC Control
- Publication number 20240349460
- Publication date Oct 17, 2024
- SolarEdge Technologies Korea Limited Company
- Ho-June Yu
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
DISPLAY DEVICE
- Publication number 20240321204
- Publication date Sep 26, 2024
- SAMSUNG DISPLAY CO., LTD.
- Jeong Hun BANG
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
DISPLAY DEVICE
- Publication number 20230397462
- Publication date Dec 7, 2023
- SAMSUNG DISPLAY CO., LTD.
- Young Jin CHO
Information Patent Application
CLEANING SOLUTION PRODUCTION SYSTEMS AND METHODS, AND PLASMA REACTI...
- Publication number 20210351047
- Publication date Nov 11, 2021
- Samsung Electronics Co., Ltd.
- Beom Jin YOO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Containerized HVAC Control
- Publication number 20210204447
- Publication date Jul 1, 2021
- Kokam Co., Ltd.
- Ho-June Yu
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
DISPLAY DEVICE
- Publication number 20200302860
- Publication date Sep 24, 2020
- SAMSUNG DISPLAY CO., LTD.
- Mi Hae Kim
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
CLEANING SOLUTION PRODUCTION SYSTEMS AND METHODS, AND PLASMA REACTI...
- Publication number 20200035515
- Publication date Jan 30, 2020
- Samsung Electronics Co., Ltd.
- Beom Jin YOO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISPLAY APPARATUS AND CONTROLLING METHOD THEREOF
- Publication number 20190180638
- Publication date Jun 13, 2019
- Samsung Electronics Co., Ltd.
- Dai-boong LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INPUT SENSING UNIT AND DISPLAY DEVICE INCLUDING THE SAME
- Publication number 20190018541
- Publication date Jan 17, 2019
- SAMSUNG DISPLAY CO., LTD.
- Jeong Yun HAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DISPLAY APPARATUS AND CONTROLLING METHOD THEREOF
- Publication number 20150339936
- Publication date Nov 26, 2015
- Samsung Electronics Co., Ltd.
- Dai-boong LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DISPLAY APPARATUS
- Publication number 20150245488
- Publication date Aug 27, 2015
- Samsung Electronics Co., Ltd.
- Hyo Jae JANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DISPLAY DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20150212378
- Publication date Jul 30, 2015
- Samsung Electronics Co., Ltd.
- Eui-Dong HWANG
- G02 - OPTICS
Information Patent Application
TEST APPARATUS HAVING MULTIPLE TEST SITES AT ONE HANDLER AND ITS TE...
- Publication number 20080197874
- Publication date Aug 21, 2008
- Samsung Electronics Co., Ltd.
- Ae-Yong CHUNG
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM OF SEMICONDUCTOR DEVICE HAVING A HANDLER REMOTE CONTROL...
- Publication number 20070290707
- Publication date Dec 20, 2007
- Samsung Electronics Co., Ltd.
- Ae-Yong CHUNG
- G01 - MEASURING TESTING
Information Patent Application
Test kit semiconductor package and method of testing semiconductor...
- Publication number 20060187647
- Publication date Aug 24, 2006
- Hyun-Guen Iy
- G01 - MEASURING TESTING
Information Patent Application
Handoff system and method between different kinds of devices, SIP s...
- Publication number 20060187943
- Publication date Aug 24, 2006
- SAMSUNG ELECTRONICS CO., LTD.
- Se-jong Oh
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Test system of semiconductor device having a handler remote control...
- Publication number 20060158211
- Publication date Jul 20, 2006
- Ae-Yong Chung
- G01 - MEASURING TESTING
Information Patent Application
Connector for testing a semiconductor package
- Publication number 20060121757
- Publication date Jun 8, 2006
- Young-Bae Chung
- G01 - MEASURING TESTING
Information Patent Application
Test board of semiconductor tester having modified input/output pri...
- Publication number 20060085715
- Publication date Apr 20, 2006
- Yong-Woon Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Multichip package test
- Publication number 20050258858
- Publication date Nov 24, 2005
- Samsung Electronics Co., Ltd.
- Young-Gu Shin
- G01 - MEASURING TESTING
Information Patent Application
Fuse regions of a semiconductor memory device and methods of fabric...
- Publication number 20050236688
- Publication date Oct 27, 2005
- Kwang-Kyu Bang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Burn-in test apparatus for BGA packages using forced heat exhaust
- Publication number 20050179457
- Publication date Aug 18, 2005
- Byung-Jun Min
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus having multiple test sites at one handler and its te...
- Publication number 20050168236
- Publication date Aug 4, 2005
- Samsung Electronics Co., Ltd.
- Ae-Yong Chung
- G01 - MEASURING TESTING
Information Patent Application
Flash memory test system and method capable of test time reduction
- Publication number 20050102589
- Publication date May 12, 2005
- Samsung Electronics Co., Ltd.
- Dong-Kyoo Park
- G11 - INFORMATION STORAGE
Information Patent Application
Apparatus and method for performing parallel test on integrated cir...
- Publication number 20050007140
- Publication date Jan 13, 2005
- Woo-Il Kim
- G01 - MEASURING TESTING
Information Patent Application
Method for testing a remnant batch of semiconductor devices
- Publication number 20040253753
- Publication date Dec 16, 2004
- Samsung Electronics Co., Ltd.
- Ae-yong Chung
- G01 - MEASURING TESTING
Information Patent Application
Method for electrical testing of semiconductor package that detects...
- Publication number 20040207387
- Publication date Oct 21, 2004
- Ae-yong Chung
- G01 - MEASURING TESTING
Information Patent Application
Integrated monitoring burn-in test method for multi-chip package
- Publication number 20040145387
- Publication date Jul 29, 2004
- Geum-Jin Yun
- G01 - MEASURING TESTING
Information Patent Application
Multichip package test
- Publication number 20040119491
- Publication date Jun 24, 2004
- Young-Gu Shin
- G01 - MEASURING TESTING
Information Patent Application
Test kit for semiconductor package and method for testing semicondu...
- Publication number 20040112142
- Publication date Jun 17, 2004
- Byoung-Jun Min
- G01 - MEASURING TESTING

Jeong Ho BANG

Person

Patents Grantslast 30 patents

Display device

Containerized HVAC control

Cleaning solution production systems and methods, and plasma reacti...

Display apparatus and controlling method thereof

Cleaning solution production systems and methods, and plasma reacti...

Display device

Input sensing unit and display device including the same

Display apparatus

Handoff system and method between different kinds of devices, SIP s...

Test apparatus having multiple head boards at one handler and its t...

Fuse regions of a semiconductor memory device and methods of fabric...

Connector for testing a semiconductor package

Test system of semiconductor device having a handler remote control...

Test apparatus having multiple test sites at one handler and its te...

Multichip package test

Flash memory test system and method capable of test time reduction

Test system of semiconductor device having a handler remote control...

Apparatus and method for performing parallel test on integrated cir...

Burn-in test apparatus for BGA packages using forced heat exhaust

Test kit for semiconductor package and method for testing semicondu...

Method for electrical testing of semiconductor package that detects...

Multichip package test

Method for testing a remnant batch of semiconductor devices

Test apparatus having multiple test sites at one handler and its te...

Laser link structure capable of preventing an upper crack and broad...

Fuse box including make-link and redundant address decoder having t...

Method of electrically testing semiconductor devices

Wafer treatment method for protecting fuse box of semiconductor chip

Plasma display panel apparatus and method of protecting an over cur...

Apparatus for generating dynamic focus signal

Patents Applicationslast 30 patents

Containerized HVAC Control

DISPLAY DEVICE

DISPLAY DEVICE

CLEANING SOLUTION PRODUCTION SYSTEMS AND METHODS, AND PLASMA REACTI...

Containerized HVAC Control

DISPLAY DEVICE

CLEANING SOLUTION PRODUCTION SYSTEMS AND METHODS, AND PLASMA REACTI...

DISPLAY APPARATUS AND CONTROLLING METHOD THEREOF

INPUT SENSING UNIT AND DISPLAY DEVICE INCLUDING THE SAME

DISPLAY APPARATUS AND CONTROLLING METHOD THEREOF

DISPLAY APPARATUS

DISPLAY DEVICE AND MANUFACTURING METHOD THEREOF

TEST APPARATUS HAVING MULTIPLE TEST SITES AT ONE HANDLER AND ITS TE...

TEST SYSTEM OF SEMICONDUCTOR DEVICE HAVING A HANDLER REMOTE CONTROL...

Test kit semiconductor package and method of testing semiconductor...

Handoff system and method between different kinds of devices, SIP s...

Test system of semiconductor device having a handler remote control...

Connector for testing a semiconductor package

Test board of semiconductor tester having modified input/output pri...

Multichip package test

Fuse regions of a semiconductor memory device and methods of fabric...

Burn-in test apparatus for BGA packages using forced heat exhaust

Test apparatus having multiple test sites at one handler and its te...

Flash memory test system and method capable of test time reduction

Apparatus and method for performing parallel test on integrated cir...

Method for testing a remnant batch of semiconductor devices

Method for electrical testing of semiconductor package that detects...

Integrated monitoring burn-in test method for multi-chip package

Multichip package test

Test kit for semiconductor package and method for testing semicondu...