Jeong-ho MUN

Follow

Person

Yongin-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Photoresist composition for deep ultraviolet light patterning metho...
- Patent number 10,983,434
- Issue date Apr 20, 2021
- Samsung Electronics Co., Ltd.
- Jeong-ho Mun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma monitoring apparatus and plasma processing system
- Patent number 10,825,666
- Issue date Nov 3, 2020
- Samsung Electronics Co., Ltd.
- Kyeong-Hun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Calibrator of an optical emission spectroscopy
- Patent number 10,753,800
- Issue date Aug 25, 2020
- Samsung Electronics Co., Ltd.
- Jeong-Il Mun
- G01 - MEASURING TESTING
Information Patent Grant
Plasma monitoring apparatus, and plasma processing apparatus includ...
- Patent number 10,748,749
- Issue date Aug 18, 2020
- Samsung Electronics Co., Ltd.
- Jeong Il Mun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating integrated circuit devices
- Patent number 10,732,506
- Issue date Aug 4, 2020
- Samsung Electronics Co., Ltd.
- Suk-koo Hong
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE MANUFACTURING METHOD
- Publication number 20230282475
- Publication date Sep 7, 2023
- Samsung Electronics Co., Ltd.
- Eun Hyea KO
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SEMICONDUCTOR DEVICE MANUFACTURING METHOD
- Publication number 20230142732
- Publication date May 11, 2023
- Samsung Electronics Co., Ltd.
- Eun Hyea KO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA MONITORING APPARATUS AND PLASMA PROCESSING SYSTEM
- Publication number 20200066499
- Publication date Feb 27, 2020
- Samsung Electronics Co., Ltd.
- Kyeong-Hun KIM
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATOR OF AN OPTICAL EMISSION SPECTROSCOPY
- Publication number 20190301937
- Publication date Oct 3, 2019
- Samsung Electronics Co., Ltd.
- Jeong-Il MUN
- G01 - MEASURING TESTING
Information Patent Application
PHOTORESIST COMPOSITION FOR DEEP ULTRAVIOLET LIGHT PATTERNING METHO...
- Publication number 20190101826
- Publication date Apr 4, 2019
- Samsung Electronics Co., Ltd.
- Jeong-ho MUN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF FABRICATING INTEGRATED CIRCUIT DEVICES
- Publication number 20190096662
- Publication date Mar 28, 2019
- Samsung Electronics Co., Ltd.
- Suk-koo HONG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY