Jeonghoon Ko

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Seoul, KR

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Patents Grantslast 30 patents

Information Patent Grant
Proximity correction methods for semiconductor manufacturing processes
- Patent number 11,733,603
- Issue date Aug 22, 2023
- Samsung Electronics Co., Ltd.
- Taehoon Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic devices generating verification vector for verifying sem...
- Patent number 11,669,773
- Issue date Jun 6, 2023
- Samsung Electronics Co., Ltd.
- Seungju Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor fault analysis device and fault analysis method thereof
- Patent number 10,650,910
- Issue date May 12, 2020
- Samsung Electronics Co., Ltd.
- Changwook Jeong
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods of measuring patterns and methods of manufacturing semicond...
- Patent number 10,254,236
- Issue date Apr 9, 2019
- Samsung Electronics Co., Ltd.
- Sung-Bo Shim
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
PROXIMITY CORRECTION METHODS FOR SEMICONDUCTOR MANUFACTURING PROCESSES
- Publication number 20210405521
- Publication date Dec 30, 2021
- Samsung Electronics Co., Ltd.
- Taehoon Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DEVICES GENERATING VERIFICATION VECTOR FOR VERIFYING SEM...
- Publication number 20210117193
- Publication date Apr 22, 2021
- Samsung Electronics Co., Ltd.
- Seungju Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR FAULT ANALYSIS DEVICE AND FAULT ANALYSIS METHOD THEREOF
- Publication number 20190385695
- Publication date Dec 19, 2019
- Samsung Electronics Co., Ltd.
- Changwook JEONG
- G01 - MEASURING TESTING