Jeongnam HAN

Person

Seoul, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor devices and methods for manufacturing the same
- Patent number 10,128,336
- Issue date Nov 13, 2018
- Samsung Electronics Co., Ltd.
- Sangjine Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices including an etch stop pattern and a sacrific...
- Patent number 9,966,432
- Issue date May 8, 2018
- Samsung Electronics Co., Ltd.
- Sangjine Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices having spacer protection pattern
- Patent number 9,859,432
- Issue date Jan 2, 2018
- Samsung Electronics, Inc.
- Yongsun Ko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of fabricating the same
- Patent number 9,716,162
- Issue date Jul 25, 2017
- Samsung Electronics Co., Ltd.
- Sangjine Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having dual metal silicide layers and method o...
- Patent number 9,117,692
- Issue date Aug 25, 2015
- Samsung Electronics Co., Ltd.
- Sangjine Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices having passive element in recessed portion of...
- Patent number 8,901,663
- Issue date Dec 2, 2014
- Samsung Electronics Co., Ltd.
- Sukhun Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having dual metal silicide layers and method o...
- Patent number 8,889,552
- Issue date Nov 18, 2014
- Samsung Electronics Co., Ltd.
- Sangline Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device having dual gate diel...
- Patent number 8,859,371
- Issue date Oct 14, 2014
- Samsung Electronics Co., Ltd.
- Myung Geun Song
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having metal plug and method of manufacturing...
- Patent number 8,841,769
- Issue date Sep 23, 2014
- Samsung Electronics Co., Ltd.
- Sangjine Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices having passive element in recessed portion of...
- Patent number 8,790,988
- Issue date Jul 29, 2014
- Samsung Electronics Co., Ltd.
- Sukhun Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer test method and wafer test apparatus
- Patent number 8,228,089
- Issue date Jul 24, 2012
- Samsung Electronics Co., Ltd.
- Youngok Kim
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
- Publication number 20170301773
- Publication date Oct 19, 2017
- Samsung Electronics Co., Ltd.
- Sangjine PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Devices
- Publication number 20170154991
- Publication date Jun 1, 2017
- Samsung Electronics Co., Ltd.
- Yongsun Ko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES AND METHODS FOR MANUFACTURING THE SAME
- Publication number 20160163861
- Publication date Jun 9, 2016
- Sangjine PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES AND METHODS FOR MANUFACTURING THE SAME
- Publication number 20160163798
- Publication date Jun 9, 2016
- Sangjine PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
- Publication number 20160027901
- Publication date Jan 28, 2016
- Samsung Electronics Co., Ltd.
- Sangjine PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
- Publication number 20150108584
- Publication date Apr 23, 2015
- Samsung Electronics Co., Ltd.
- Yangsoo Son
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE HAVING DUAL METAL SILICIDE LAYERS AND METHOD O...
- Publication number 20150028423
- Publication date Jan 29, 2015
- Samsung Electronics Co., Ltd.
- Sangjine Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE HAVING DUAL METAL SILICIDE LAYERS AND METHOD O...
- Publication number 20140248761
- Publication date Sep 4, 2014
- Samsung Electronics Co., Ltd.
- Sangjine Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES HAVING PASSIVE ELEMENT IN RECESSED PORTION OF...
- Publication number 20140099768
- Publication date Apr 10, 2014
- Sukhun Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE HAVING METAL PLUG AND METHOD OF MANUFACTURING...
- Publication number 20140048939
- Publication date Feb 20, 2014
- Samsung Electronics Co., Ltd.
- Sangjine Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE HAVING DUAL GATE DIEL...
- Publication number 20130244414
- Publication date Sep 19, 2013
- Samsung Electronics Co., Ltd.
- Myung Geun Song
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
- Publication number 20130149835
- Publication date Jun 13, 2013
- Samsung Electronics Co., Ltd.
- Yangsoo Son
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES AND METHODS FOR MANUFACTURING THE SAME
- Publication number 20120086048
- Publication date Apr 12, 2012
- Samsung Electronics Co., Ltd.
- Sangjine Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES HAVING PASSIVE ELEMENT IN RECESSED PORTION OF...
- Publication number 20120043614
- Publication date Feb 23, 2012
- Samsung Electronics Co., Ltd.
- Sukhun Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER TEST METHOD AND WAFER TEST APPARATUS
- Publication number 20100200431
- Publication date Aug 12, 2010
- Youngok Kim
- H01 - BASIC ELECTRIC ELEMENTS

Jeongnam HAN

Person

Patents Grantslast 30 patents

Semiconductor devices and methods for manufacturing the same

Semiconductor devices including an etch stop pattern and a sacrific...

Semiconductor devices having spacer protection pattern

Semiconductor device and method of fabricating the same

Semiconductor device having dual metal silicide layers and method o...

Semiconductor devices having passive element in recessed portion of...

Semiconductor device having dual metal silicide layers and method o...

Method for manufacturing semiconductor device having dual gate diel...

Semiconductor device having metal plug and method of manufacturing...

Semiconductor devices having passive element in recessed portion of...

Wafer test method and wafer test apparatus

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME

Semiconductor Devices

SEMICONDUCTOR DEVICES AND METHODS FOR MANUFACTURING THE SAME

SEMICONDUCTOR DEVICES AND METHODS FOR MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME

SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME

SEMICONDUCTOR DEVICE HAVING DUAL METAL SILICIDE LAYERS AND METHOD O...

SEMICONDUCTOR DEVICE HAVING DUAL METAL SILICIDE LAYERS AND METHOD O...

SEMICONDUCTOR DEVICES HAVING PASSIVE ELEMENT IN RECESSED PORTION OF...

SEMICONDUCTOR DEVICE HAVING METAL PLUG AND METHOD OF MANUFACTURING...

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE HAVING DUAL GATE DIEL...

SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME

SEMICONDUCTOR DEVICES AND METHODS FOR MANUFACTURING THE SAME

SEMICONDUCTOR DEVICES HAVING PASSIVE ELEMENT IN RECESSED PORTION OF...

WAFER TEST METHOD AND WAFER TEST APPARATUS