JER-SHENG LEE

Person

  • New Taipei, TW

Patents Grantslast 30 patents

  • Information Patent Grant

    Flatness measuring apparatus

    • Patent number 9,074,867
    • Issue date Jul 7, 2015
    • Shenzhen Futaihong Precision Industry Co., Ltd.
    • Jin-Shan Cui
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    FLATNESS MEASURING APPARATUS

    • Publication number 20140182153
    • Publication date Jul 3, 2014
    • FIH (HONG KONG) LIMITED
    • JIN-SHAN CUI
    • G01 - MEASURING TESTING