Jeremiah D. Hogan

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Dallas, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for inline removal of impurities from wet chem...
- Patent number 6,200,478
- Issue date Mar 13, 2001
- Texas Instruments Incorporated
- Russell A. Chorush
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Apparatus and method for measuring contaminants in semiconductor pr...
- Patent number 6,032,513
- Issue date Mar 7, 2000
- Texas Instruments Incorporated
- Russell A. Chorush
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inline removal of impurities from wet chem...
- Patent number 6,017,453
- Issue date Jan 25, 2000
- Texas Instruments Incorporated
- Russell A. Chorush
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
On-line monitor for moisture contamination in HCL gas and copper co...
- Patent number 5,578,829
- Issue date Nov 26, 1996
- Texas Instruments Incorporated
- Robert T. Talasek
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD OF COMPARING TWO MATERIALS WITHIN A MATERIAL DIST...
- Publication number 20110108568
- Publication date May 12, 2011
- Jeremiah Hogan
- B67 - OPENING, CLOSING OR CLEANING BOTTLES, JARS OR SIMILAR CONTAINERS LIQUID...