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Jeremy A. Van Derslice
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Lincoln, NE, US
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Patents Grants
last 30 patents
Information
Patent Grant
Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...
Patent number
11,675,208
Issue date
Jun 13, 2023
J. A. Woollam Co., Inc.
Stefan Schoeche
G01 - MEASURING TESTING
Information
Patent Grant
Snapshot ellipsometer
Patent number
11,391,666
Issue date
Jul 19, 2022
J. A. Woollam Co., Inc.
Griffin A. P. Hovorka
G01 - MEASURING TESTING
Information
Patent Grant
Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...
Patent number
11,035,729
Issue date
Jun 15, 2021
J.A. WOQLLAM CO., INC.
Jeremy A. Van Derslice
G01 - MEASURING TESTING
Information
Patent Grant
Snapshot ellipsometer
Patent number
10,634,607
Issue date
Apr 28, 2020
J. A. Woollam Co., Inc.
Griffin A. P. Hovorka
G01 - MEASURING TESTING
Information
Patent Grant
Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...
Patent number
10,422,739
Issue date
Sep 24, 2019
J. A. Woollam Co., Inc.
Jeremy A. Van Derslice
G01 - MEASURING TESTING
Information
Patent Grant
Method to analyze spectroscopic ellipsometry or intensity data of p...
Patent number
10,175,160
Issue date
Jan 8, 2019
J. A. Woollam Co., Inc.
Stefan Schoeche
G01 - MEASURING TESTING
Information
Patent Grant
Reflectometer, spectrophometer, ellipsometer and polarimeter system...
Patent number
10,132,684
Issue date
Nov 20, 2018
J.A. Woolam Co., Inc.
Jeremy A. Van Derslice
G01 - MEASURING TESTING
Information
Patent Grant
Method to analyze spectroscopic ellipsometry data of porous samples...
Patent number
9,976,902
Issue date
May 22, 2018
J.A. Woolam Co., Inc.
Stefan Schoeche
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method to enhance sensitivity to surface normal optical functions o...
Patent number
9,599,569
Issue date
Mar 21, 2017
J. A. Woollam Co., Inc.
Thomas E. Tiwald
G02 - OPTICS
Information
Patent Grant
System and method for investigating change in optical properties of...
Patent number
9,546,943
Issue date
Jan 17, 2017
J. A. Woollam Co., Inc.
Jeremy A. Vanderslice
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...
Publication number
20220244169
Publication date
Aug 4, 2022
J. A. WOOLLAM CO., INC.
Ping He
G02 - OPTICS
Information
Patent Application
Snapshot Ellipsometer
Publication number
20200116626
Publication date
Apr 16, 2020
J. A. WOOLLAM CO., INC.
Griffin A. P. Hovorka
G01 - MEASURING TESTING
Information
Patent Application
Method to enhance sensitivity to surface normal optical functions o...
Publication number
20160274032
Publication date
Sep 22, 2016
J. A. WOOLLAM CO., INC.
Thomas E. Tiwald
G02 - OPTICS
Information
Patent Application
Method to enhance sensitivity to surface-normal optical functions o...
Publication number
20140356520
Publication date
Dec 4, 2014
J. A. WOOLLAM CO., INC.
Thomas E. Tiwald
G01 - MEASURING TESTING