Jeremy Daniel Schaub

Person

Yonkers, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Structure and method of integrating waveguides, photodetectors and...
- Patent number 9,356,163
- Issue date May 31, 2016
- International Business Machines Corporation
- Fei Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory system including a spiral cache
- Patent number 9,009,415
- Issue date Apr 14, 2015
- International Business Machines Corporation
- Fadi H. Gebara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Temperature-profiled device fingerprint generation and authenticati...
- Patent number 8,880,954
- Issue date Nov 4, 2014
- International Business Machines Corporation
- Fadi H. Gebara
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit for bias temperature instability recovery measurements
- Patent number 8,676,516
- Issue date Mar 18, 2014
- International Business Machines Corporation
- Fadi H. Gebara
- G01 - MEASURING TESTING
Information Patent Grant
Memory system including a spiral cache
- Patent number 8,543,768
- Issue date Sep 24, 2013
- International Business Machines Corporation
- Fadi H. Gebara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systolic networks for a spiral cache
- Patent number 8,539,185
- Issue date Sep 17, 2013
- International Business Machines Corporation
- Fadi H. Gebara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Temperature-profiled device fingerprint generation and authenticati...
- Patent number 8,495,431
- Issue date Jul 23, 2013
- International Business Machines Corporation
- Fadi H. Gebara
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit for bias temperature instability recovery measurements
- Patent number 8,229,683
- Issue date Jul 24, 2012
- International Business Machines Corporation
- Fadi H. Gebara
- G01 - MEASURING TESTING
Information Patent Grant
Temperature-profiled device fingerprint generation and authenticati...
- Patent number 8,219,857
- Issue date Jul 10, 2012
- International Business Machines Corporation
- Fadi H. Gebara
- G11 - INFORMATION STORAGE
Information Patent Grant
Voltage comparator having improved kickback and jitter characteristics
- Patent number 8,111,090
- Issue date Feb 7, 2012
- International Business Machines Corporation
- Fadi H. Gebara
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Embedded photodetector apparatus in a 3D CMOS chip stack
- Patent number 8,063,424
- Issue date Nov 22, 2011
- International Business Machines Corporation
- Fadi H. Gebara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing of transimpedance amplifiers
- Patent number 7,977,618
- Issue date Jul 12, 2011
- International Business Machines Corporation
- John Andrew Guckenberger
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Delay-based bias temperature instability recovery measurements for...
- Patent number 7,949,482
- Issue date May 24, 2011
- International Business Machines Corporation
- Fadi H. Gebara
- G01 - MEASURING TESTING
Information Patent Grant
System and circuit for determining data signal jitter via asynchron...
- Patent number 7,930,120
- Issue date Apr 19, 2011
- International Business Machines Corporation
- Hayden C. Cranford, Jr.
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Structure for and method of fabricating a high-speed CMOS-compatibl...
- Patent number 7,915,653
- Issue date Mar 29, 2011
- International Business Machines Corporation
- Jack O. Chu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for optical modulation amplitude measurement
- Patent number 7,885,540
- Issue date Feb 8, 2011
- International Business Machines Corporation
- Casimer DeCusatis
- G01 - MEASURING TESTING
Information Patent Grant
Interconnecting (mapping) a two-dimensional optoelectronic (OE) dev...
- Patent number 7,883,277
- Issue date Feb 8, 2011
- International Business Machines Corporation
- Russell A. Budd
- G02 - OPTICS
Information Patent Grant
System and circuit for constructing a synchronous signal diagram fr...
- Patent number 7,792,649
- Issue date Sep 7, 2010
- International Business Machines Corporation
- Hayden C. Cranford, Jr.
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Testing of transimpedance amplifiers
- Patent number 7,745,775
- Issue date Jun 29, 2010
- International Business Machines Corporation
- John Andrew Guckenberger
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Generating an eye diagram of integrated circuit transmitted signals
- Patent number 7,684,478
- Issue date Mar 23, 2010
- International Business Machines Corporation
- Hayden C. Cranford, Jr.
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Voltage comparator apparatus and method having improved kickback an...
- Patent number 7,570,082
- Issue date Aug 4, 2009
- International Business Machines Corporation
- Fadi H. Gebara
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Correction of delay-based metric measurements using delay circuits...
- Patent number 7,548,823
- Issue date Jun 16, 2009
- International Business Machines Corporation
- Harmander Singh
- G01 - MEASURING TESTING
Information Patent Grant
Calibration of multi-metric sensitive delay measurement circuits
- Patent number 7,542,862
- Issue date Jun 2, 2009
- International Business Machines Corporation
- Harmander Singh
- G01 - MEASURING TESTING
Information Patent Grant
Structure for and method of fabricating a high-speed CMOS-compatibl...
- Patent number 7,510,904
- Issue date Mar 31, 2009
- International Business Machines Corporation
- Jack O. Chu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for measuring signal characteristics of data sign...
- Patent number 7,478,011
- Issue date Jan 13, 2009
- International Business Machines Corporation
- Fadi H. Gebara
- G01 - MEASURING TESTING
Information Patent Grant
Interconnecting (mapping) a two-dimensional optoelectronic (OE) dev...
- Patent number 7,474,815
- Issue date Jan 6, 2009
- International Business Machines Corporation
- Russell A. Budd
- G02 - OPTICS
Information Patent Grant
Determining data signal jitter via asynchronous sampling
- Patent number 7,389,192
- Issue date Jun 17, 2008
- International Business Machines Corporation
- Hayden C. Cranford, Jr.
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for constructing a synchronous signal diagram...
- Patent number 7,383,160
- Issue date Jun 3, 2008
- International Business Machines Corporation
- Hayden C. Cranford, Jr.
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
High frequency ring oscillator with feed-forward paths
- Patent number 7,321,269
- Issue date Jan 22, 2008
- International Business Machines Corporation
- Alan J. Drake
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for determining jitter and pulse width from cl...
- Patent number 7,286,947
- Issue date Oct 23, 2007
- International Business Machines Corporation
- Hayden C. Cranford, Jr.
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEMPERATURE-PROFILED DEVICE FINGERPRINT GENERATION AND AUTHENTICATI...
- Publication number 20130247145
- Publication date Sep 19, 2013
- International Business Machines Corporation
- Fadi H. Gebara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY SYSTEM INCLUDING A SPIRAL CACHE
- Publication number 20130179641
- Publication date Jul 11, 2013
- International Business Machines Corporation
- Fadi H. Gebara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST CIRCUIT FOR BIAS TEMPERATURE INSTABILITY RECOVERY MEASUREMENTS
- Publication number 20120262187
- Publication date Oct 18, 2012
- International Business Machines Corporation
- Fadi H. Gebara
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE-PROFILED DEVICE FINGERPRINT GENERATION AND AUTHENTICATI...
- Publication number 20120246494
- Publication date Sep 27, 2012
- International Business Machines Corporation
- Fadi H. Gebara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EMBEDDED PHOTODETECTOR APPARATUS IN A 3D CMOS CHIP STACK
- Publication number 20110115004
- Publication date May 19, 2011
- International Business Machines Corporation
- Fadi H. Gebara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST CIRCUIT FOR BIAS TEMPERATURE INSTABILITY RECOVERY MEASUREMENTS
- Publication number 20110074394
- Publication date Mar 31, 2011
- International Business Machines Corporation
- Fadi H. Gebara
- G01 - MEASURING TESTING
Information Patent Application
MEMORY SYSTEM INCLUDING A SPIRAL CACHE
- Publication number 20100122033
- Publication date May 13, 2010
- International Business Machines Corporation
- Fadi H. Gebara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTOLIC NETWORKS FOR A SPIRAL CACHE
- Publication number 20100122012
- Publication date May 13, 2010
- International Business Machines Corporation
- Fadi H. Gebara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING OF TRANSIMPEDANCE AMPLIFIERS
- Publication number 20100045370
- Publication date Feb 25, 2010
- International Business Machines Corporation
- John Andrew Guckenberger
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEM AND CIRCUIT FOR DETERMINING DATA SIGNAL JITTER VIA ASYNCHRON...
- Publication number 20100030503
- Publication date Feb 4, 2010
- Hayden C. Cranford, Jr.
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Temperature-Profiled Device Fingerprint Generation and Authenticati...
- Publication number 20090326840
- Publication date Dec 31, 2009
- International Business Machines Corporation
- Fadi H. Gebara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Delay-Based Bias Temperature Instability Recovery Measurements for...
- Publication number 20090319202
- Publication date Dec 24, 2009
- International Business Machines Corporation
- Fadi H. Gebara
- G01 - MEASURING TESTING
Information Patent Application
Methods and Apparatus for Optical Modulation Amplitude Measurement
- Publication number 20090245789
- Publication date Oct 1, 2009
- International Business Machines Corporation
- Casimer DeCusatis
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE COMPARATOR HAVING IMPROVED KICKBACK AND JITTER CHARACTERISTICS
- Publication number 20090153196
- Publication date Jun 18, 2009
- International Business Machines Corporation
- Fadi H. Gebara
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CALIBRATION OF MULTI-METRIC SENSITIVE DELAY MEASUREMENT CIRCUITS
- Publication number 20090144006
- Publication date Jun 4, 2009
- Harmander Singh
- G01 - MEASURING TESTING
Information Patent Application
Calibration of Multi-Metric Sensitive Delay Measurement Circuits
- Publication number 20080288197
- Publication date Nov 20, 2008
- Harmander Singh
- G01 - MEASURING TESTING
Information Patent Application
Correction of Delay-Based Metric Measurements Using Delay Circuits...
- Publication number 20080288196
- Publication date Nov 20, 2008
- Harmander Singh
- G01 - MEASURING TESTING
Information Patent Application
INTERCONNECTING (MAPPING) A TWO-DIMENSIONAL OPTOELECTRONIC (OE) DEV...
- Publication number 20080205817
- Publication date Aug 28, 2008
- International Business Machines Corporation
- Russell A. Budd
- G02 - OPTICS
Information Patent Application
STRUCTURE FOR AND METHOD OF FABRICATING A HIGH-SPEED CMOS-COMPATIBL...
- Publication number 20080185618
- Publication date Aug 7, 2008
- International Business Machines Corporation
- Jack O. Chu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND CIRCUIT FOR CONSTRUCTING A SYNCHRONOUS SIGNAL DIAGRAM FR...
- Publication number 20080177489
- Publication date Jul 24, 2008
- Hayden C. Cranford
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD OF GENERATING AN EYE DIAGRAM OF INTEGRATED CIRCUIT TRANSMITT...
- Publication number 20080159369
- Publication date Jul 3, 2008
- International Business Machines Corporation
- Hayden C. Cranford
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD AND SYSTEM FOR MEASURING SIGNAL CHARACTERISTICS OF DATA SIGN...
- Publication number 20080147340
- Publication date Jun 19, 2008
- Fadi H. Gebara
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CONSTRUCTING A SYNCHRONOUS SIGNAL DIAGRAM...
- Publication number 20080126010
- Publication date May 29, 2008
- Hayden C. Cranford
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
STRUCTURE FOR AND METHOD OF FABRICATING A HIGH-SPEED CMOS-COMPATIBL...
- Publication number 20080113467
- Publication date May 15, 2008
- International Business Machines Corporation
- Jack O. Chu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VOLTAGE COMPARATOR APPARATUS AND METHOD HAVING IMPROVED KICKBACK AN...
- Publication number 20080042692
- Publication date Feb 21, 2008
- International Business Machines Corporation
- Fadi H. Gebara
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
High Frequency Ring Oscillator With Feed-Forward Paths
- Publication number 20080024233
- Publication date Jan 31, 2008
- International Business Machines Corporation
- Alan J. Drake
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
A Method of Generating an Eye Diagram of Integrated Circuit Transmi...
- Publication number 20080002762
- Publication date Jan 3, 2008
- Hayden C. Cranford
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method and Apparatus for Determining Data Signal Jitter Via Asynchr...
- Publication number 20080004821
- Publication date Jan 3, 2008
- Hayden C. Cranford, Jr.
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING JITTER AND PULSE WIDTH FROM CL...
- Publication number 20070244656
- Publication date Oct 18, 2007
- Hayden C. Cranford
- G01 - MEASURING TESTING
Information Patent Application
Interconnecting (mapping) a two-dimensional optoelectronic (OE) dev...
- Publication number 20070217750
- Publication date Sep 20, 2007
- International Business Machines Corporation
- Russell A. Budd
- G02 - OPTICS

Jeremy Daniel Schaub

Person

Patents Grantslast 30 patents

Structure and method of integrating waveguides, photodetectors and...

Memory system including a spiral cache

Temperature-profiled device fingerprint generation and authenticati...

Test circuit for bias temperature instability recovery measurements

Memory system including a spiral cache

Systolic networks for a spiral cache

Temperature-profiled device fingerprint generation and authenticati...

Test circuit for bias temperature instability recovery measurements

Temperature-profiled device fingerprint generation and authenticati...

Voltage comparator having improved kickback and jitter characteristics

Embedded photodetector apparatus in a 3D CMOS chip stack

Testing of transimpedance amplifiers

Delay-based bias temperature instability recovery measurements for...

System and circuit for determining data signal jitter via asynchron...

Structure for and method of fabricating a high-speed CMOS-compatibl...

Methods and apparatus for optical modulation amplitude measurement

Interconnecting (mapping) a two-dimensional optoelectronic (OE) dev...

System and circuit for constructing a synchronous signal diagram fr...

Testing of transimpedance amplifiers

Generating an eye diagram of integrated circuit transmitted signals

Voltage comparator apparatus and method having improved kickback an...

Correction of delay-based metric measurements using delay circuits...

Calibration of multi-metric sensitive delay measurement circuits

Structure for and method of fabricating a high-speed CMOS-compatibl...

Method and system for measuring signal characteristics of data sign...

Interconnecting (mapping) a two-dimensional optoelectronic (OE) dev...

Determining data signal jitter via asynchronous sampling

Method and apparatus for constructing a synchronous signal diagram...

High frequency ring oscillator with feed-forward paths

Method and apparatus for determining jitter and pulse width from cl...

Patents Applicationslast 30 patents

TEMPERATURE-PROFILED DEVICE FINGERPRINT GENERATION AND AUTHENTICATI...

MEMORY SYSTEM INCLUDING A SPIRAL CACHE

TEST CIRCUIT FOR BIAS TEMPERATURE INSTABILITY RECOVERY MEASUREMENTS

TEMPERATURE-PROFILED DEVICE FINGERPRINT GENERATION AND AUTHENTICATI...

EMBEDDED PHOTODETECTOR APPARATUS IN A 3D CMOS CHIP STACK

TEST CIRCUIT FOR BIAS TEMPERATURE INSTABILITY RECOVERY MEASUREMENTS

MEMORY SYSTEM INCLUDING A SPIRAL CACHE

SYSTOLIC NETWORKS FOR A SPIRAL CACHE

TESTING OF TRANSIMPEDANCE AMPLIFIERS

SYSTEM AND CIRCUIT FOR DETERMINING DATA SIGNAL JITTER VIA ASYNCHRON...

Temperature-Profiled Device Fingerprint Generation and Authenticati...

Delay-Based Bias Temperature Instability Recovery Measurements for...

Methods and Apparatus for Optical Modulation Amplitude Measurement

VOLTAGE COMPARATOR HAVING IMPROVED KICKBACK AND JITTER CHARACTERISTICS

CALIBRATION OF MULTI-METRIC SENSITIVE DELAY MEASUREMENT CIRCUITS

Calibration of Multi-Metric Sensitive Delay Measurement Circuits

Correction of Delay-Based Metric Measurements Using Delay Circuits...

INTERCONNECTING (MAPPING) A TWO-DIMENSIONAL OPTOELECTRONIC (OE) DEV...

STRUCTURE FOR AND METHOD OF FABRICATING A HIGH-SPEED CMOS-COMPATIBL...

SYSTEM AND CIRCUIT FOR CONSTRUCTING A SYNCHRONOUS SIGNAL DIAGRAM FR...

METHOD OF GENERATING AN EYE DIAGRAM OF INTEGRATED CIRCUIT TRANSMITT...

METHOD AND SYSTEM FOR MEASURING SIGNAL CHARACTERISTICS OF DATA SIGN...

METHOD AND APPARATUS FOR CONSTRUCTING A SYNCHRONOUS SIGNAL DIAGRAM...

STRUCTURE FOR AND METHOD OF FABRICATING A HIGH-SPEED CMOS-COMPATIBL...

VOLTAGE COMPARATOR APPARATUS AND METHOD HAVING IMPROVED KICKBACK AN...

High Frequency Ring Oscillator With Feed-Forward Paths

A Method of Generating an Eye Diagram of Integrated Circuit Transmi...

Method and Apparatus for Determining Data Signal Jitter Via Asynchr...

METHOD AND APPARATUS FOR DETERMINING JITTER AND PULSE WIDTH FROM CL...

Interconnecting (mapping) a two-dimensional optoelectronic (OE) dev...