Jeremy Graham

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Portland, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Automated ion-beam alignment for dual-beam instrument
- Patent number 12,154,757
- Issue date Nov 26, 2024
- FEI Company
- Jeremy Graham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam impurity identification
- Patent number 10,763,079
- Issue date Sep 1, 2020
- FEI Company
- Jeremy Graham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system aperture
- Patent number 8,907,296
- Issue date Dec 9, 2014
- FEI Company
- N. William Parker
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
SECONDARY ELECTRON DETECTOR FOR ION BEAM SYSTEMS
- Publication number 20250102451
- Publication date Mar 27, 2025
- FEI Company
- Vojtech MAHEL
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED ION-BEAM ALIGNMENT FOR DUAL-BEAM INSTRUMENT
- Publication number 20230377830
- Publication date Nov 23, 2023
- FEI Company
- Jeremy Graham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FOCUSED ION BEAM IMPURITY IDENTIFICATION
- Publication number 20200266030
- Publication date Aug 20, 2020
- FEI Company
- Jeremy Graham
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam System Aperture
- Publication number 20130181140
- Publication date Jul 18, 2013
- FEI Company
- N. William Parker
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING