Jeremy O'Dell

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Manor, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Accurate measurement of layer dimensions using XRF
- Patent number 7,804,934
- Issue date Sep 28, 2010
- Jordan Valley Semiconductors Ltd.
- Dileep Agnihotri
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ACCURATE MEASUREMENT OF LAYER DIMENSIONS USING XRF
- Publication number 20090074137
- Publication date Mar 19, 2009
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Dileep Agnihotri
- G01 - MEASURING TESTING
Information Patent Application
Accurate measurement of layer dimensions using XRF
- Publication number 20080049895
- Publication date Feb 28, 2008
- Dileep Agnihotri
- G01 - MEASURING TESTING